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1. (WO2019044103) IMAGING ELEMENT, LAMINATED IMAGING ELEMENT, AND SOLID-STATE IMAGING DEVICE
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Pub. No.: WO/2019/044103 International Application No.: PCT/JP2018/022008
Publication Date: 07.03.2019 International Filing Date: 08.06.2018
IPC:
H01L 27/146 (2006.01) ,H04N 5/374 (2011.01) ,H01L 27/30 (2006.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14
including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144
Devices controlled by radiation
146
Imager structures
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
5
Details of television systems
30
Transforming light or analogous information into electric information
335
using solid-state image sensors [SSIS]
369
SSIS architecture; Circuitry associated therewith
374
Addressed sensors, e.g. MOS or CMOS sensors
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
28
including components using organic materials as the active part, or using a combination of organic materials with other materials as the active part
30
with components specially adapted for sensing infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation; with components specially adapted for either the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
Applicants:
ソニーセミコンダクタソリューションズ株式会社 SONY SEMICONDUCTOR SOLUTIONS CORPORATION [JP/JP]; 神奈川県厚木市旭町四丁目14番1号 4-14-1, Asahi-cho, Atsugi-shi, Kanagawa 2430014, JP
Inventors:
河合 信宏 KAWAI Nobuhiro; JP
富樫 秀晃 TOGASHI Hideaki; JP
古閑 史彦 KOGA Fumihiko; JP
山口 哲司 YAMAGUCHI Tetsuji; JP
平田 晋太郎 HIRATA Shintarou; JP
渡部 泰一郎 WATANABE Taiichiro; JP
安藤 良洋 ANDO Yoshihiro; JP
Agent:
山本 孝久 YAMAMOTO Takahisa; JP
吉井 正明 YOSHII Masaaki; JP
Priority Data:
2017-16758631.08.2017JP
Title (EN) IMAGING ELEMENT, LAMINATED IMAGING ELEMENT, AND SOLID-STATE IMAGING DEVICE
(FR) ÉLÉMENT D'IMAGERIE, ÉLÉMENT D'IMAGERIE STRATIFIÉ ET DISPOSITIF D'IMAGERIE À SEMI-CONDUCTEUR
(JA) 撮像素子、積層型撮像素子及び固体撮像装置
Abstract:
(EN) According to the present invention, a solid-state imaging element is provided with a pixel having: a first imaging element; a second imaging element; a third imaging element; and an on-chip micro-lens 90, wherein the first imaging element includes a first electrode 11, a third electrode 12, and a second electrode 16. The pixel is further provided with: a third electrode control line VOA that is connected to the third electrode 12; and a plurality of control lines 62B which are respectively connected to various transistors provided in the second imaging element and the third imaging element, and which are different from the third electrode control line VOA. In the pixel, the distance between the center of the on-chip micro-lens 90 provided to the pixel and one of the plurality of control lines 62B provided in the pixel is shorter than the distance between the center of the on-chip micro-lens 90 provided to the pixel and the third electrode control line VOA provided to the pixel.
(FR) Selon la présente invention, un élément d'imagerie à semi-conducteur comprend un pixel ayant : un premier élément d'imagerie ; un second élément d'imagerie ; un troisième élément d'imagerie ; et une microlentille sur puce 90, le premier élément d'imagerie comprenant une première électrode 11, une troisième électrode 12, et une seconde électrode 16. Le pixel comprend en outre : une troisième ligne de commande d'électrode VOA qui est connectée à la troisième électrode 12 ; et une pluralité de lignes de commande 62B qui sont respectivement connectées à divers transistors fournis dans le second élément d'imagerie et le troisième élément d'imagerie, et qui sont différentes de la troisième ligne de commande d'électrode VOA. Dans le pixel, la distance entre le centre de la micro-lentille sur puce 90 fournie au pixel et l'une de la pluralité de lignes de commande 62B fournie au pixel est plus courte que la distance entre le centre de la micro-lentille sur puce 90 fournie au pixel et la troisième ligne de commande d'électrode VOA fournie au pixel.
(JA) 固体撮像素子は、第1撮像素子と第2撮像素子と第3撮像素子とオンチップ・マイクロ・レンズ90とを備えた画素を有し、第1撮像素子は第1電極11と第3電極12と第2電極16とを備え、画素は、第3電極12に接続した第3電極制御線VOAと、第2撮像素子及び第3撮像素子に備えられた各種トランジスタのそれぞれに接続され、第3電極制御線VOAとは異なる複数本の制御線62Bとを更に備え、画素は、画素に備わるオンチップ・マイクロ・レンズ90の中心と、該画素に備わる前記複数本の制御線62Bのいずれかとの間の距離が、該画素に備わるオンチップ・マイクロ・レンズ90の中心と該画素に備わる前記第3電極制御線VOAとの間の距離よりも小さい。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)