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1. (WO2019043551) DETECTING UNRELIABLE BITS IN TRANSISTOR CIRCUITRY
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Pub. No.: WO/2019/043551 International Application No.: PCT/IB2018/056485
Publication Date: 07.03.2019 International Filing Date: 27.08.2018
IPC:
G09C 1/00 (2006.01) ,H04L 9/08 (2006.01)
G PHYSICS
09
EDUCATING; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
C
CIPHERING OR DECIPHERING APPARATUS FOR CRYPTOGRAPHIC OR OTHER PURPOSES INVOLVING THE NEED FOR SECRECY
1
Apparatus or methods whereby a given sequence of signs, e.g. an intelligible text, is transformed into an unintelligible sequence of signs by transposing the signs or groups of signs or by replacing them by others according to a predetermined system
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
L
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
9
Arrangements for secret or secure communication
06
the encryption apparatus using shift registers or memories for blockwise coding, e.g. D.E.S. systems
08
Key distribution
Applicants:
BAR ILAN UNIVERSITY [IL/IL]; 5290002 Ramat Gan, IL
Inventors:
SHOR, Joseph; IL
WEIZMAN, Yoav; IL
SCHIFMANN, Yitzhak; IL
Agent:
KLEIN, David; IL
Priority Data:
15/694,80903.09.2017US
Title (EN) DETECTING UNRELIABLE BITS IN TRANSISTOR CIRCUITRY
(FR) DÉTECTION DE BITS NON FIABLES DANS DE LA CIRCUITERIE À TRANSISTORS
Abstract:
(EN) A method for detecting unreliable bits in transistor circuitry includes applying a controllable physical parameter to a transistor circuitry, thereby causing a variation in a digital code of a cryptologic element in the transistor circuitry, the variation being a tilt or bias in a positive or negative direction. An amount of variation in the digital code of the cryptologic element is determined. Unreliable bits in the transistor circuitry are defined as those bits for which the variation is in a range defined as unreliable.
(FR) Selon l'invention, un procédé de détection de bits non fiables dans de la circuiterie à transistors consiste à appliquer un paramètre physique contrôlable à de la circuiterie à transistors, ce qui provoque une variation d'un code numérique d'un élément cryptologique dans la circuiterie à transistors, la variation étant une inclinaison ou une polarisation dans une direction positive ou négative. Une grandeur de variation du code numérique de l'élément cryptologique est déterminée. Des bits non fiables dans la circuiterie à transistors sont définis comme étant les bits pour lesquels la variation est dans une plage définie comme étant non fiable.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)