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1. (WO2019041664) MEASURING METHOD AND DEVICE FOR MEASURING DISPLAY PANEL
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Pub. No.: WO/2019/041664 International Application No.: PCT/CN2017/117336
Publication Date: 07.03.2019 International Filing Date: 20.12.2017
IPC:
G02F 1/13 (2006.01)
G PHYSICS
02
OPTICS
F
DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
1
Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
01
for the control of the intensity, phase, polarisation or colour
13
based on liquid crystals, e.g. single liquid crystal display cells
Applicants:
惠科股份有限公司 HKC CORPORATION LIMITED [CN/CN]; 中国广东省深圳市 宝安区石岩街道水田村民营工业园惠科工业园厂房1、2、3栋,九州阳光1号厂房5、7楼 5th and 7th Floor of Factory Building 1 Jiuzhou Yangguang, Factory Buildings 1, 2, 3 of HKC Industrial Park, Privately Operated Industrial Park Shuitian Village, Shiyan Sub-district, Bao'an District Shenzhen, Guangdong 518000, CN
重庆惠科金渝光电科技有限公司 CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CO., LTD. [CN/CN]; 中国重庆市 巴南区界石镇石景路1号 No. 1 Shijing Rd., Jieshi Town, Ba'nan District Chongqing 401320, CN
Inventors:
李嘉航 LEE, Chia-Hang; CN
Agent:
北京汇泽知识产权代理有限公司 BEIJING HUIZE INTELLECTUAL PROPERTY LAW LLC; 中国北京市 海淀区知春路6号锦秋国际大厦A座18层张瑾 ZHANG, Jin A18, Horizon International Tower No. 6, Zhichun Road, Haidian District Beijing 100088, CN
Priority Data:
201710750925.128.08.2017CN
Title (EN) MEASURING METHOD AND DEVICE FOR MEASURING DISPLAY PANEL
(FR) PROCÉDÉ ET DISPOSITIF DE MESURE POUR MESURER UN PANNEAU D'AFFICHAGE
(ZH) 量测显示面板的量测方法及其装置
Abstract:
(EN) A measurement method and device (700) for measuring a display panel (710). The measurement method for measuring a display panel (710) comprises: rectifying a measured picture of the display panel (710) (S310); obtaining a picture to be measured by means of a measurement device (S320); setting a photographing device to complete a photographing parameter in a measurement environment (S330); photographing, and rectifying system measurement data by means of the photographing parameter (S340); replacing a display panel to be measured (710) (S350); performing gamma curve (100) measurement (S360); and outputting a gamma curve (100) (S370). The display panel (710) only needs to be rectified once, and the gamma curve (100) measurement continues to be conducted on the next display panel (710).
(FR) L'invention concerne un procédé et un dispositif de mesure (700) pour mesurer un panneau d'affichage (710). Le procédé de mesure pour mesurer un panneau d'affichage (710) consiste à: redresser une image mesurée du panneau d'affichage (710) (S310); obtenir une image à mesurer au moyen d'un dispositif de mesure (S320); régler un dispositif de photographie pour obtenir un paramètre de photographie dans un environnement de mesure (S330); photographier et rectifier des données de mesure de système au moyen du paramètre de photographie (S340); remplacer un panneau d'affichage à mesurer (710) (S350); effectuer une mesure (S360) de courbe gamma (100); et émettre une courbe gamma (100) (S370). Le panneau d'affichage (710) doit seulement être rectifié une fois, et la mesure de la courbe gamma (100) continue à être effectuée sur le panneau d'affichage suivant (710).
(ZH) 一种量测显示面板(710)的量测方法及其装置(700),此量测显示面板(710)的量测方法,包括:校正一显示面板(710)的量测画面(S310);通过一量测装置获取待测画面(S320);设置一拍摄仪器在一量测环境下完成一拍摄参数(S330);通过此拍摄参数,进行拍摄与校正系统量测数据(S340);更换一待测显示面板(710)(S350);进行伽玛曲线(100)量测(S360);以及进行一伽玛曲线(100)输出(S370);其中此显示面板(710)仅需校正一次,并进行持续量测下一片显示面板(710)的伽玛曲线(100)量测。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Chinese (ZH)
Filing Language: Chinese (ZH)