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1. (WO2019032911) SYSTEMS AND METHODS FOR FAULT DETECTION IN EMISSION-GUIDED RADIOTHERAPY
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/032911 International Application No.: PCT/US2018/046132
Publication Date: 14.02.2019 International Filing Date: 09.08.2018
IPC:
A61B 6/00 (2006.01) ,A61B 6/10 (2006.01) ,A61N 5/00 (2006.01) ,A61N 5/01 (2006.01) ,G01T 1/24 (2006.01)
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
B
DIAGNOSIS; SURGERY; IDENTIFICATION
6
Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
B
DIAGNOSIS; SURGERY; IDENTIFICATION
6
Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
10
Application or adaptation of safety means
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
N
ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
5
Radiation therapy
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
N
ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
5
Radiation therapy
01
Devices for producing movement of radiation source during therapy
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
24
with semiconductor detectors
Applicants:
REFLEXION MEDICAL, INC. [US/US]; 25821 Industrial Boulevard Suite 200 Hayward, California 94545, US
Inventors:
OLCOTT, Peter Demetri; US
BIENIOSEK, Matthew Francis; US
Agent:
YANG, Hain-Ann Hsueh; US
MAYER, Mika Reiner; US
Priority Data:
62/543,14009.08.2017US
Title (EN) SYSTEMS AND METHODS FOR FAULT DETECTION IN EMISSION-GUIDED RADIOTHERAPY
(FR) SYSTÈMES ET PROCÉDÉS DE DÉTECTION DE DÉFAUT DANS UNE RADIOTHÉRAPIE GUIDÉE PAR ÉMISSION
Abstract:
(EN) Disclosed herein are systems and methods for monitoring calibration of positron emission tomography (PET) systems. In some variations, the systems include an imaging assembly having a gantry comprising a plurality of positron emission detectors. A housing may be coupled to the gantry, and the housing may include a bore and a radiation source holder spaced away from a patient scan region within the bore. A processor may be configured to receive positron emission data from the positron emission detectors and to distinguish the positron emission data from the radiation source holder and from the patient scan region. A fault signal may be generated when the positron emission data from the radiation source holder exceeds one or more threshold parameters or criteria.
(FR) L'invention concerne des systèmes et des procédés de surveillance de l'étalonnage de systèmes de tomographie par émission de positrons (TEP). Dans certaines variantes, les systèmes incluent un ensemble d'imagerie possédant un portique qui comprend une pluralité de détecteurs d'émission de positrons. Un boîtier peut être couplé au portique, et le boîtier peut inclure un trou et un support de source de rayonnement éloigné d'une région de balayage de patient à l'intérieur du trou. Un processeur peut être conçu pour recevoir des données d'émission de positrons provenant des détecteurs d'émission de positrons et pour distinguer les données d'émission de positrons provenant du support de source de rayonnement et de la région de balayage de patient. Un signal de défaut peut être généré lorsque les données d'émission de positrons provenant du support de source de rayonnement dépassent un ou plusieurs paramètres ou critères de seuil.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)