Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2019032430) MEASURING THE POSITION OF OBJECTS IN SPACE
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/032430 International Application No.: PCT/US2018/045327
Publication Date: 14.02.2019 International Filing Date: 06.08.2018
IPC:
G01B 9/02 (2006.01) ,G01C 3/08 (2006.01) ,G01S 17/66 (2006.01) ,G01S 17/88 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9
Instruments as specified in the subgroups and characterised by the use of optical measuring means
02
Interferometers
G PHYSICS
01
MEASURING; TESTING
C
MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
3
Measuring distances in line of sight; Optical rangefinders
02
Details
06
Use of electric means to obtain final indication
08
Use of electric radiation detectors
G PHYSICS
01
MEASURING; TESTING
S
RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
17
Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
66
Tracking systems using electromagnetic waves other than radio waves
G PHYSICS
01
MEASURING; TESTING
S
RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
17
Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
88
Lidar systems, specially adapted for specific applications
Applicants:
APRE INSTRUMENTS, INC. [US/US]; 2440 W. Ruthrauff Rd., Suite 100 Tucson, AZ 85705, US
Inventors:
OLSZAK, Artur; US
Agent:
DURANDO, Antonio R.; US
Priority Data:
16/055,12505.08.2018US
62/541,90607.08.2017US
Title (EN) MEASURING THE POSITION OF OBJECTS IN SPACE
(FR) MESURE DE LA POSITION D'OBJETS DANS L'ESPACE
Abstract:
(EN) Interference fringes (IB) in a bullseye pattern (FIG. 5) are produced by a measurement module (20) by interfering a flat reference beam (BRR) with a spherical beam (DRR) reflected by a sphere (40, 102) connected to the tip (12,104) of a probe (10,100) in point contact with a test object (O). The bullseye interferogram is registered at a detector and analyzed conventionally to produce a position measurement of the tip of the probe. A beam correction module (70) is used to align the bullseye interferogram with the illumination axis (Z) of the measurement module (20). By combining at least three such measurement modules (106,108, 110) in a coordinate measurement machine, the three-dimensional position of the probe (100) and of its point contact (104) with the test object (O) can be obtained from analysis of the bullseye interferograms registered by the detectors with high precision and greatly reduced Abbe error.
(FR) Des franges d'interférence (IB) sont produites selon un motif en anneaux (FIG. 5) par un module de mesure (20) en faisant interférer un faisceau de référence plat (BRR) avec un faisceau sphérique (DRR) réfléchi par une sphère (40, 102) reliée à la pointe (12, 104) d'une sonde (10, 100) en contact ponctuel avec un objet d'essai (O). L'interférogramme en anneaux est enregistré au niveau d'un détecteur et analysé de manière classique pour produire une mesure de position de la pointe de la sonde. Un module (70) de correction de faisceau est utilisé pour aligner l'interférogramme en anneaux avec l'axe d'éclairage (Z) du module de mesure (20). En combinant au moins trois modules parmi de tels modules de mesure (106, 108, 110) dans une machine de mesure de coordonnées, la position tridimensionnelle de la sonde (100), et de son contact ponctuel (104) avec l'objet d'essai (O), peut être obtenue à partir de l'analyse des interférogrammes en anneaux enregistrés par les détecteurs avec une précision élevée et une erreur d'Abbe considérablement réduite.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)