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1. (WO2019032109) SYSTEM AND METHOD FOR VERIFYING A DIOPTER SETTING AND RANGE OF AN OPTICAL SYSTEM EYEPIECE
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/032109 International Application No.: PCT/US2017/046205
Publication Date: 14.02.2019 International Filing Date: 10.08.2017
IPC:
G01M 11/02 (2006.01)
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
11
Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
02
Testing of optical properties
Applicants:
BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC. [US/US]; P.O. Box 868 NHQ1-719 Nashua, NH 03061-0868, US
Inventors:
SPAHR, Erik, J.; US
MASTERS, David, L.; US
Agent:
WERNOW, Howard, L.; US
MIHALIC, Nicholas A.; US
SEBOLT, Joseph A.; US
FERGUSON, Fiona H.; US
Priority Data:
Title (EN) SYSTEM AND METHOD FOR VERIFYING A DIOPTER SETTING AND RANGE OF AN OPTICAL SYSTEM EYEPIECE
(FR) SYSTÈME ET PROCÉDÉ POUR VÉRIFIER UN RÉGLAGE ET ÉCART DIOPTRIQUES D'UN OCULAIRE DE SYSTÈME OPTIQUE
Abstract:
(EN) The present disclosure relates to a system and method for verifying a diopter setting and range of an optical system eyepiece by utilizing an image sensor to view and analyze test patterns of spots displayed within the optical system eyepiece and calculating the diopter setting and range of the optical system eyepiece from an observed change in the test pattern at different diopter settings
(FR) La présente invention concerne un système et un procédé pour vérifier un réglage et écart dioptriques d'un oculaire de système optique en utilisant un capteur d'image pour visualiser et analyser des mires de points affichées à l'intérieur de l'oculaire de système optique et calculer le réglage et l'écart dioptriques de l'oculaire de système optique à partir d'un changement observé dans la mire au niveau de différents réglages dioptriques.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)