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1. (WO2019031584) MEASUREMENT DEVICE AND IRRADIATION DEVICE
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/031584 International Application No.: PCT/JP2018/029924
Publication Date: 14.02.2019 International Filing Date: 09.08.2018
IPC:
G01N 21/64 (2006.01) ,G02B 21/06 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
06
Means for illuminating specimen
Applicants:
国立研究開発法人科学技術振興機構 JAPAN SCIENCE AND TECHNOLOGY AGENCY [JP/JP]; 埼玉県川口市本町四丁目1番8号 4-1-8, Honcho, Kawaguchi-shi, Saitama 3320012, JP
Inventors:
安井 武史 YASUI Takeshi; JP
岩田 哲郎 IWATA Tetsuo; JP
水谷 康弘 MIZUTANI Yasuhiro; JP
南川 丈夫 MINAMIKAWA Takeo; JP
水野 孝彦 MIZUNO Takahiko; JP
長谷 栄治 HASE Eiji; JP
山本 裕紹 YAMAMOTO Hirotsugu; JP
Agent:
松沼 泰史 MATSUNUMA Yasushi; JP
荒 則彦 ARA Norihiko; JP
西澤 和純 NISHIZAWA Kazuyoshi; JP
大槻 真紀子 OTSUKI Makiko; JP
Priority Data:
2017-15439209.08.2017JP
Title (EN) MEASUREMENT DEVICE AND IRRADIATION DEVICE
(FR) DISPOSITIF DE MESURE ET DISPOSITIF D'IRRADIATION
(JA) 計測装置及び照射装置
Abstract:
(EN) This measurement device comprises: a light emission unit that emits a plurality of spectral beams including two or more spectra respectively distributed over different frequencies, the light emission unit emitting the spectral beams by varying the neighbouring frequency intervals from one another; a beam-condensing unit that condenses, respectively onto a plurality of different beam-condensing point regions on a sample, said two or more spectra by shifting the same from one another while causing the same to overlap one another in overlapping regions; and a detection unit that acquires signals of fluorescence beats including information on the sample and lighting up by interference light beats in the respective overlapping regions of the sample.
(FR) La présente invention concerne un dispositif de mesure qui comprend : une unité d'émission de lumière qui émet une pluralité de faisceaux spectraux comprenant au moins deux spectres distribués respectivement sur différentes fréquences, l'unité d'émission de lumière émettant les faisceaux spectraux en faisant varier les intervalles de fréquence voisins les uns par rapport aux autres ; une unité de condensation de faisceau qui condense, respectivement sur une pluralité de différentes régions de point de condensation de faisceau sur un échantillon, lesdits au moins deux spectres en les décalant l'un de l'autre tout en amenant ceux-ci à se chevaucher les uns les autres dans des régions se chevauchant ; et une unité de détection qui acquiert des signaux de battements de fluorescence comprenant des informations sur l'échantillon et l'éclairage par des battements de lumière d'interférence dans les régions de chevauchement respectives de l'échantillon.
(JA) 本発明の計測装置は、互いに異なる周波数で分布しているスペクトルを2以上含むスペクトル光を、互いに隣接周波数間隔を異ならせて複数出射する光出射部と、試料の複数の異なる集光点領域のそれぞれに2以上のスペクトルを重畳領域で重ね且つ互いにずらして集光させる集光部と、前記試料における複数の重畳領域のそれぞれでの干渉光ビートにより発光し且つ前記試料の情報を含む蛍光ビートの信号を取得する検出部と、を備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)