Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2019031098) SOLID-STATE IMAGING DEVICE
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/031098 International Application No.: PCT/JP2018/024906
Publication Date: 14.02.2019 International Filing Date: 29.06.2018
IPC:
H04N 5/369 (2011.01) ,G02B 1/11 (2015.01) ,G02B 3/00 (2006.01) ,H04N 9/07 (2006.01)
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
5
Details of television systems
30
Transforming light or analogous information into electric information
335
using solid-state image sensors [SSIS]
369
SSIS architecture; Circuitry associated therewith
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
1
Optical elements characterised by the material of which they are made; Optical coatings for optical elements
10
Optical coatings produced by application to, or surface treatment of, optical elements
11
Anti-reflection coatings
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
3
Simple or compound lenses
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
9
Details of colour television systems
04
Picture signal generators
07
with one pick-up device only
Applicants:
ソニーセミコンダクタソリューションズ株式会社 SONY SEMICONDUCTOR SOLUTIONS CORPORATION [JP/JP]; 神奈川県厚木市旭町四丁目14番1号 4-14-1, Asahi-cho, Atsugi-shi, Kanagawa 2430014, JP
Inventors:
大塚 洋一 OOTSUKA, Yoichi; JP
Agent:
特許業務法人酒井国際特許事務所 SAKAI INTERNATIONAL PATENT OFFICE; JP
Priority Data:
2017-15585410.08.2017JP
Title (EN) SOLID-STATE IMAGING DEVICE
(FR) DISPOSITIF D'IMAGERIE À SEMI-CONDUCTEURS
(JA) 固体撮像装置
Abstract:
(EN) [Problem] To reduce an ineffective region by use of microlenses having a high refractive index and by reduction of an interval between the microlenses. [Solution] According to the present disclosure, provided is a solid-state imaging device equipped with: photodetectors disposed so as to correspond to unit pixels in a light-receiving region; and a microlens having a planar shape of a square shape, which corresponds to each of the unit pixels; wherein each microlens has a first refractive material, the film thickness of which decreases toward the four corners of the square at boundaries with adjacent unit pixels.
(FR) Le problème décrit par la présente invention est de réduire une région inefficace à l'aide de microlentilles présentant un indice de réfraction élevé et par réduction d'un intervalle entre les microlentilles. La solution selon la présente invention concerne un dispositif d'imagerie à semi-conducteurs comprenant : des photodétecteurs disposés de façon à correspondre à des pixels unitaires dans une région de réception de lumière ; et une microlentille présentant une forme plane dans une forme carrée qui correspond à chacun des pixels unitaires ; chaque microlentille comportant un premier matériau de réfraction, dont l'épaisseur de film diminue vers les quatre coins du carré au niveau des limites avec des pixels unitaires adjacents.
(JA) 【課題】マイクロレンズを高屈折率にするとともに、マイクロレンズ同士の間隔を狭くして無効領域を減少する。 【解決手段】本開示によれば、受光領域の単位画素に対応して設けられた受光素子と、前記単位画素のそれぞれに対応する矩形形状の平面形状からなるマイクロレンズと、を備え、前記マイクロレンズは、隣接する前記単位画素との境界において、前記矩形形状の四隅に近いほど膜厚が薄い第1の屈折材を有する、固体撮像装置が提供される。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)