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1. (WO2019030945) CAUSE ESTIMATION METHOD AND PROGRAM
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/030945 International Application No.: PCT/JP2018/001561
Publication Date: 14.02.2019 International Filing Date: 19.01.2018
IPC:
G05B 19/418 (2006.01) ,G06Q 50/04 (2012.01)
G PHYSICS
05
CONTROLLING; REGULATING
B
CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
19
Programme-control systems
02
electric
418
Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control (DNC), flexible manufacturing systems (FMS), integrated manufacturing systems (IMS), computer integrated manufacturing (CIM)
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
Q
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTING PURPOSES, NOT OTHERWISE PROVIDED FOR
50
Systems or methods specially adapted for a specific business sector, e.g. utilities or tourism
04
Manufacturing
Applicants:
株式会社日立ソリューションズ HITACHI SOLUTIONS, LTD. [JP/JP]; 東京都品川区東品川四丁目12番7号 4-12-7, Higashishinagawa, Shinagawa-ku, Tokyo 1400002, JP
Inventors:
森口 昭 MORIGUCHI Akira; JP
Agent:
特許業務法人平木国際特許事務所 HIRAKI & ASSOCIATES; 東京都港区愛宕二丁目5-1 愛宕グリーンヒルズMORIタワー32階 Atago Green Hills MORI Tower 32F, 5-1, Atago 2-chome, Minato-ku, Tokyo 1056232, JP
Priority Data:
2017-15273907.08.2017JP
Title (EN) CAUSE ESTIMATION METHOD AND PROGRAM
(FR) PROCÉDÉ ET PROGRAMME D’ESTIMATION DE CAUSE
(JA) 原因推定方法およびプログラム
Abstract:
(EN) A method for estimating the cause of a manufacturing loss comprises: a step of acquiring production performance information relating to a production process with respect to each of a plurality of individual products; a step of calculating a process time in the production process with respect to each of the plurality of individual products on the basis of the production performance information; a step of acquiring information relating to a manufacturing event indicating a status of the production process; a step of associating the manufacturing event with individual products on the basis of the production performance information and the information relating to the manufacturing event; and a step of causing a distribution of the process times of the plurality of individual products and a distribution of the process times of the individual products with which the manufacturing event is associated to be displayed on a display device in a superposed manner.
(FR) L’invention concerne un procédé d’estimation de la cause d’une perte de fabrication, comprenant : une étape consistant à d’acquérir des informations de performance de production relatives à un processus de production de chaque produit d’une pluralité de produits individuels ; une étape consistant à calculer une durée de processus du processus de production pour chaque produit de la pluralité de produits individuels, d’après les informations de performance de production ; une étape consistant à d’acquérir des informations relatives à un événement de fabrication, indiquant un état du processus de production ; une étape consistant à associer l’événement de fabrication à des produits individuels d’après les informations de performance de production et les informations relatives à l’événement de fabrication ; et une étape consistant à afficher en superposition, sur un dispositif d’affichage, une distribution des durées de processus de la pluralité de produits individuels et une distribution des durées de processus des produits individuels auxquels l’événement de fabrication est associé.
(JA) 製造ロスの原因推定方法は、複数の製品個体のそれぞれについて生産工程の生産実績情報を取得するステップと、生産実績情報に基づいて複数の製品個体のそれぞれについての生産工程における処理時間を算出するステップと、生産工程のステータスを示す製造イベントに関する情報を取得するステップと、生産実績情報と製造イベントに関する情報とに基づいて、製造イベントと製品個体とを紐づけるステップと、複数の製品個体の処理時間の分布と、製造イベントが紐づけられた製品個体の処理時間の分布と、を重畳して表示装置に表示するステップと、を含む。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)