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1. (WO2019028499) DEVICE AND METHOD FOR MONITORING MATERIAL FLOW PARAMETERS ALONG A PASSAGE
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2019/028499 International Application No.: PCT/AU2018/050819
Publication Date: 14.02.2019 International Filing Date: 07.08.2018
IPC:
G01F 1/66 (2006.01) ,G01N 21/47 (2006.01) ,G01N 21/85 (2006.01) ,G01N 21/94 (2006.01) ,G01F 1/74 (2006.01) ,G01F 1/86 (2006.01)
G PHYSICS
01
MEASURING; TESTING
F
MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME
1
Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through the meter in a continuous flow
66
by measuring frequency, phase shift, or propagation time of electromagnetic or other waves, e.g. ultrasonic flowmeters
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
47
Scattering, i.e. diffuse reflection
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
85
Investigating moving fluids or granular solids
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
94
Investigating contamination, e.g. dust
G PHYSICS
01
MEASURING; TESTING
F
MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME
1
Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through the meter in a continuous flow
74
Devices for measuring flow of a fluid or flow of a fluent solid material in suspension in another fluid
G PHYSICS
01
MEASURING; TESTING
F
MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME
1
Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through the meter in a continuous flow
76
Devices for measuring mass flow of a fluid or a fluent solid material
86
Indirect mass flowmeters, e.g. measuring volume flow and density, temperature, or pressure
Applicants:
COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION [AU/AU]; Clunies Ross Street Acton, Australian Capital Territory 2601, AU
Inventors:
MALOS, John; AU
DUNN, Mark; AU
REID, Peter; AU
Agent:
SHELSTON IP PTY LTD; Level 9, 60 Margaret Street Sydney, New South Wales 2000, AU
Priority Data:
201790318810.08.2017AU
Title (EN) DEVICE AND METHOD FOR MONITORING MATERIAL FLOW PARAMETERS ALONG A PASSAGE
(FR) DISPOSITIF ET PROCÉDÉ DE SURVEILLANCE DE PARAMÈTRES DE FLUX DE MATÉRIAU LE LONG D'UN PASSAGE
Abstract:
(EN) Described herein is a device (1) for measuring parameters of a material (3) flowing along a passage (5), the passage having two longitudinally spaced apart ends and transverse sides defined by one or more sidewalls (7, 9). The device (1) includes a laser source (15) positioned at a first location within or adjacent a side of the passage (5) and configured to generate a laser beam (17) at one or more predetermined frequencies. A beam projection element (21, 27) projects the laser beam (17) transversely across the passage (5) to irradiate the material (3) within a measuring zone (19). The measuring zone (19) includes a transverse region extending greater than 50% of the width of the passage (5). An optical imaging device (29) is positioned at a second location within or adjacent the passage (5) and configured to capture images of backscattered light from material (3) within the measuring zone (19). A processor (41) is in communication with the optical imaging device (29) and is configured to process the captured images and perform a scattering analysis to determine parameters of the material (3) through the passage (5).
(FR) L'invention concerne un dispositif (1) permettant de mesurer des paramètres d'un matériau (3) s'écoulant le long d'un passage (5), le passage possédant deux extrémités espacées longitudinalement et des côtés transversaux définis par une ou plusieurs parois latérales (7, 9). Le dispositif (1) comprend une source laser (15) positionnée à un premier emplacement à l'intérieur ou à proximité d'un côté du passage (5) et conçue pour générer un faisceau laser (17) à une ou plusieurs fréquences prédéterminées. Un élément de projection de faisceau (21, 27) projette le faisceau laser (17) transversalement à travers le passage (5) afin d'irradier le matériau (3) à l'intérieur d'une zone de mesure (19). La zone de mesure (19) comprend une région transversale s'étendant davantage que 50 % de la largeur du passage (5). Un dispositif d'imagerie optique (29) est positionné à un second emplacement à l'intérieur ou à proximité du passage (5) et conçu pour capturer des images d'une lumière rétrodiffusée par un matériau (3) à l'intérieur de la zone de mesure (19). Un processeur (41) est en communication avec le dispositif d'imagerie optique (29) et est conçu pour traiter les images capturées et effectuer une analyse de diffusion afin de déterminer des paramètres du matériau (3) à travers le passage (5).
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)