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1. (WO2019028452) MATERIAL LAYER DETECTION AND PROCESSING
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Pub. No.: WO/2019/028452 International Application No.: PCT/US2018/045347
Publication Date: 07.02.2019 International Filing Date: 06.08.2018
IPC:
B23K 26/352 (2014.01) ,B23K 26/36 (2014.01) ,B23K 26/03 (2006.01) ,B23K 26/062 (2014.01)
[IPC code unknown for B23K 26/352]
B PERFORMING OPERATIONS; TRANSPORTING
23
MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
K
SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
26
Working by laser beam, e.g. welding, cutting, boring
36
Removing material
B PERFORMING OPERATIONS; TRANSPORTING
23
MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
K
SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
26
Working by laser beam, e.g. welding, cutting, boring
02
Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
03
Observing the workpiece
[IPC code unknown for B23K 26/062]
Applicants:
IPG PHOTONICS CORPORATION [US/US]; 50 Old Webster Road Oxford, MA 01540, US
Inventors:
SQUIRES, David; US
BUDD, Andrew; US
DALLAROSA, Joseph; US
Agent:
KING, Timothy, J.; US
Priority Data:
62/541,28204.08.2017US
Title (EN) MATERIAL LAYER DETECTION AND PROCESSING
(FR) DÉTECTION ET TRAITEMENT D'UNE COUCHE DE MATÉRIAU
Abstract:
(EN) Material layer detection and depthwise layer processing is disclosed. A depthwise material profile is generated based on detected optical characteristics of layer material and laser processing is controlled based on a comparison of the depthwise material profile and measured optical properties of a layer. Laser processing may be controlled to avoid damage to underlying material. Laser process parameters may be modified based on measured optical properties of a layer measured to provide optimized laser processing.
(FR) L'invention concerne la détection et le traitement suivant la profondeur de couche d'une couche de matériau. Un profil de matériau suivant la profondeur est généré d'après des caractéristiques optiques détectées du matériau de couche et un traitement par laser est commandé d'après une comparaison du profil de matériau suivant la profondeur et de propriétés optiques mesurées d'une couche. Le traitement par laser peut être commandé pour éviter l'endommagement d'un matériau sous-jacent. Des paramètres de traitement de la couche peuvent être modifiés d'après des propriétés optiques mesurées d'une couche mesurée pour assurer un traitement par laser optimisé.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)