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1. (WO2019027522) SYSTEM FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
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Pub. No.: WO/2019/027522 International Application No.: PCT/US2018/030298
Publication Date: 07.02.2019 International Filing Date: 30.04.2018
IPC:
G01N 3/42 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3
Investigating strength properties of solid materials by application of mechanical stress
40
Investigating hardness or rebound hardness
42
by performing impressions under a steady load by indentors, e.g. sphere, pyramid
Applicants:
DOW GLOBAL TECHNOLOGIES LLC [US/US]; 2040 Dow Center Midland, Michigan 48674, US
ROHM AND HAAS COMPANY [US/US]; 400 Arcola Road Collegeville, Pennsylvania 19426, US
Inventors:
MCCARTY II, Donald L.; US
SUTANTO, Erick; US
LUND, John; US
GLAD, Brayden E.; US
SINGH, Hitendra; US
Agent:
SCHWARZ, Steven J.; US
Priority Data:
62/539,38131.07.2017US
Title (EN) SYSTEM FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
(FR) SYSTÈME D'ANALYSE D'IMPACT ET DE RÉSISTANCE À LA PERFORATION
Abstract:
(EN) A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.
(FR) L'invention concerne un procédé et un système d'analyse d'une caractéristique physique d'un échantillon de film. Le système comprend un système de maintien de matériau conçu pour maintenir l'échantillon de film ; un système de test de fléchettes conçu pour tester une caractéristique physique de l'échantillon de film ; et un système de déplacement conçu pour déplacer l'échantillon de film maintenu à analyser ou à tester entre des stations. Le système de déplacement est conçu pour déplacer l'échantillon de film maintenu dans le système de maintien de matériau vers le système de test de fléchettes.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)