Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2019027521) DEVICE FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2019/027521 International Application No.: PCT/US2018/030277
Publication Date: 07.02.2019 International Filing Date: 30.04.2018
IPC:
G01N 3/42 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3
Investigating strength properties of solid materials by application of mechanical stress
40
Investigating hardness or rebound hardness
42
by performing impressions under a steady load by indentors, e.g. sphere, pyramid
Applicants:
DOW GLOBAL TECHNOLOGIES LLC [US/US]; 2040 Dow Center Midland, Michigan 48674, US
ROHM AND HAAS COMPANY [US/US]; 400 Arcola Road Collegeville, Pennsylvania 19426, US
Inventors:
MCCARTY, Donald, L.; US
SUTANTO, Erick; US
DOTSON, Larry; US
GLAD, Brayden, E.; US
SINGH, Hitendra; US
LUND, John; US
Agent:
SCHWARZ, Steven, J.; US
Priority Data:
62/539,32631.07.2017US
Title (EN) DEVICE FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
(FR) DISPOSITIF D'ANALYSE D'IMPACT ET DE RÉSISTANCE À LA PERFORATION
Abstract:
(EN) A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.
(FR) L'invention concerne un dispositif d'analyse d'une caractéristique physique d'un échantillon de film. Le dispositif comprend un système de serrage conçu pour maintenir l'échantillon de film. Le dispositif comprend en outre un système de sonde de fléchettes conçu pour tester une caractéristique physique de l'échantillon de film. Le système de sonde de fléchette comprend une sonde de fléchette, un système de propulsion conçu pour déplacer la sonde de fléchette par rapport au système de serrage et un capteur de force conçu pour mesurer une force à laquelle la sonde de fléchette est soumise pendant un mouvement de la sonde de fléchette. Le capteur de force est conçu pour mesurer une force appliquée à l'échantillon de film lorsque la sonde de fléchette vient en contact avec l'échantillon de film.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)