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1. (WO2019027518) SYSTEM FOR TEAR ANALYSIS OF FILMS
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Pub. No.: WO/2019/027518 International Application No.: PCT/US2018/030210
Publication Date: 07.02.2019 International Filing Date: 30.04.2018
IPC:
G01N 3/08 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3
Investigating strength properties of solid materials by application of mechanical stress
08
by applying steady tensile or compressive forces
Applicants:
DOW GLOBAL TECHNOLOGIES LLC [US/US]; 2040 Dow Center Midland, MI 48674, US
Inventors:
SOLANKI, Sanjay, C.; US
MCCARTY, Donald, L.; US
GUNTHER, Robert, A.; US
WANG, Jin; US
MYERS, Kyle, A.; US
COLLICK, Scott, J.; US
Agent:
SCHWARZ, Steven, J.; US
Priority Data:
62/539,39931.07.2017US
Title (EN) SYSTEM FOR TEAR ANALYSIS OF FILMS
(FR) SYSTÈME D'ANALYSE DE DÉCHIRURE DE FILMS
Abstract:
(EN) A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; and a tear analysis device configured to tear the film sample and measure a characteristic of the tear. The movable system is configured to move the film sample in the material holder system to the tear analysis device.
(FR) L'invention concerne un procédé et un système d'analyse d'une caractéristique physique d'un échantillon de film. Le système comprend un système de support de matériau conçu pour supporter l'échantillon de film et un dispositif d'analyse de déchirure conçu pour déchirer l'échantillon de film et mesurer une caractéristique de la déchirure. Le système mobile est conçu pour déplacer l'échantillon de film dans le système de support de matériau vers le dispositif d'analyse de déchirure.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)