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1. (WO2019026416) EYEGLASS FRAME SHAPE MEASUREMENT DEVICE AND LENS PROCESSING DEVICE
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Pub. No.: WO/2019/026416 International Application No.: PCT/JP2018/021700
Publication Date: 07.02.2019 International Filing Date: 06.06.2018
IPC:
G01B 11/24 (2006.01) ,B24B 9/14 (2006.01) ,G02C 13/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
B PERFORMING OPERATIONS; TRANSPORTING
24
GRINDING; POLISHING
B
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
9
Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
02
characterised by a special design with respect to properties of materials specific to articles to be ground
06
of non-metallic inorganic material, e.g. stone, ceramics, porcelain
08
of glass
14
of optical work, e.g. lenses, prisms
G PHYSICS
02
OPTICS
C
SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
13
Assembling; Repairing; Cleaning
Applicants:
株式会社ニデック NIDEK.CO.,LTD [JP/JP]; 愛知県蒲郡市拾石町前浜34番地14 34-14 Maehama,Hiroishi-cho,Gamagori-shi Aichi 4430038, JP
Inventors:
滝井 通浩 TAKII, Michihiro; JP
水越 邦仁 MIZUKOSHI, Kunihito; JP
石井 友也 ISHII, Tomoya; JP
武市 教児 TAKEICHI, Kyoji; JP
Priority Data:
2017-14836631.07.2017JP
Title (EN) EYEGLASS FRAME SHAPE MEASUREMENT DEVICE AND LENS PROCESSING DEVICE
(FR) DISPOSITIF DE MESURE DE FORME DE MONTURE DE LUNETTES ET DISPOSITIF DE TRAITEMENT DE VERRE
(JA) 眼鏡枠形状測定装置、及びレンズ加工装置
Abstract:
(EN) An eyeglass frame shape measurement device for measuring the shape of an eyeglass frame, said device comprising: a light projection optical system that has a light source and is for irradiating measurement light from the light source toward a groove in the rims of the eyeglass frame, a light reception optical system that has a detector and is for using the detector to receive light that has been irradiated toward the groove in the rims of the eyeglass frame by the light projection optical system and reflected by the groove in the rims of the eyeglass frame, an acquisition means for acquiring a cross-sectional shape of the groove in the rims of the eyeglass frame on the basis of the reflected light received by the detector, and a brightness control means for controlling the brightness level of the reflected light received by the detector.
(FR) L'invention concerne un dispositif de mesure de forme de monture de lunettes destiné à mesurer la forme d'une monture de lunettes, ledit dispositif comprenant : un système optique de projection de lumière qui comporte une source de lumière et qui est destiné à émettre la lumière de mesure depuis la source de lumière vers une rainure dans les bords de la monture de lunettes, un système optique de réception de lumière qui comporte un détecteur et qui est destiné à utiliser le détecteur pour recevoir la lumière qui a été émise vers la rainure dans les bords de la monture de lunettes par le système optique de projection de lumière et réfléchie par la rainure dans les bords de la monture de lunettes, des moyens d'acquisition destinés à acquérir une forme de section transversale de la rainure dans les bords de la monture de lunettes en se basant sur la lumière réfléchie reçue par le détecteur, et des moyens de commande de luminosité destinés à commander le niveau de luminosité de la lumière réfléchie reçue par le détecteur.
(JA) 眼鏡フレームの形状を測定する眼鏡枠形状測定装置であって、光源を有し、眼鏡フレームのリムの溝に向けて光源から測定光を照射する投光光学系と、検出器を有し、投光光学系によって眼鏡フレームのリムの溝に向けて照射され、眼鏡フレームのリムの溝によって反射された測定光の反射光を検出器によって受光する受光光学系と、検出器によって受光された反射光に基づいて、眼鏡フレームのリムの溝の断面形状を取得する取得手段と、検出器によって受光される反射光の輝度レベルを制御する輝度制御手段と、を備える。 
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)