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1. (WO2019026413) IN-LIQUID MICROPARTICLE ANALYSIS SYSTEM AND IN-LIQUID MICROPARTICLE ANALYSIS METHOD
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Pub. No.: WO/2019/026413 International Application No.: PCT/JP2018/021519
Publication Date: 07.02.2019 International Filing Date: 05.06.2018
IPC:
G01N 15/14 (2006.01) ,G01N 21/05 (2006.01) ,G01N 21/64 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
10
Investigating individual particles
14
Electro-optical investigation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
03
Cuvette constructions
05
Flow-through cuvettes
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
Applicants:
シャープ株式会社 SHARP KABUSHIKI KAISHA [JP/JP]; 大阪府堺市堺区匠町1番地 1, Takumi-cho, Sakai-ku, Sakai City, Osaka 5908522, JP
国立大学法人東京大学 THE UNIVERSITY OF TOKYO [JP/JP]; 東京都文京区本郷七丁目3番1号 3-1, Hongo 7-chome, Bunkyo-ku, Tokyo 1138654, JP
Inventors:
飯塚 邦彦 IIZUKA, Kunihiko; --
藤本 義久 FUJIMOTO, Yoshihisa; --
満仲 健 MITSUNAKA, Takeshi; --
藤井 輝夫 FUJII, Teruo; JP
金 秀▲弦▼ KIM, Soo-Hyeon; JP
Agent:
特許業務法人HARAKENZO WORLD PATENT & TRADEMARK HARAKENZO WORLD PATENT & TRADEMARK; 大阪府大阪市北区天神橋2丁目北2番6号 大和南森町ビル Daiwa Minamimorimachi Building, 2-6, Tenjinbashi 2-chome Kita, Kita-ku, Osaka-shi, Osaka 5300041, JP
Priority Data:
2017-14901801.08.2017JP
Title (EN) IN-LIQUID MICROPARTICLE ANALYSIS SYSTEM AND IN-LIQUID MICROPARTICLE ANALYSIS METHOD
(FR) SYSTÈME D'ANALYSE DE MICROPARTICULES DANS UN LIQUIDE ET PROCÉDÉ D'ANALYSE DE MICROPARTICULES DANS UN LIQUIDE
(JA) 液体中微粒子分析システムおよび液体中微粒子分析方法
Abstract:
(EN) The present invention achieves a reduction in the size of an optical system for sensing fluorescence photons. A photon-sensing operation performed by a photon sensing unit (21) is controlled with reference to the timing of an irradiation operation performed by an excitation light source (50), and after excitation light irradiated in a micro flow path (10) is extinguished, photons of fluorescence produced from a subject flowing through the micro flow path (10) are sensed.
(FR) La présente invention permet de réduire la taille d'un système optique de détection de photons de fluorescence. Une opération de détection de photons effectuée par une unité de détection de photons (21) est commandée en référence à la synchronisation d'une opération d'irradiation effectuée par une source de lumière d'excitation (50), et après que la lumière d'excitation irradiée dans un micro-trajet d'écoulement (10) est éteinte, des photons de fluorescence produits par un sujet s'écoulant à travers le micro-trajet d'écoulement (10) sont détectés.
(JA) 蛍光光子を検知する光学系システムの小型化を図る。励起光源(50)の照射動作のタイミングを基準として、光子検知部(21)の光子検知動作を制御し、マイクロ流路(10)に照射された励起光の消光後に、マイクロ流路(10)中を流れている対象物から生じる蛍光の光子を検知する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)