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1. (WO2019026406) DEVICE, SPECIMEN STATE DETERMINATION METHOD, AND ANALYSIS SYSTEM
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Pub. No.: WO/2019/026406 International Application No.: PCT/JP2018/020952
Publication Date: 07.02.2019 International Filing Date: 31.05.2018
Chapter 2 Demand Filed: 30.11.2018
IPC:
G01N 35/10 (2006.01) ,C12M 1/34 (2006.01) ,G01N 21/17 (2006.01) ,G01N 35/00 (2006.01) ,G06T 7/00 (2017.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
10
Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
C CHEMISTRY; METALLURGY
12
BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
M
APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY
1
Apparatus for enzymology or microbiology
34
Measuring or testing with condition measuring or sensing means, e.g. colony counters
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
T
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
7
Image analysis, e.g. from bit-mapped to non bit-mapped
Applicants:
株式会社日立ハイテクノロジーズ HITACHI HIGH-TECHNOLOGIES CORPORATION [JP/JP]; 東京都港区西新橋一丁目24番14号 24-14, Nishi-Shimbashi 1-chome, Minato-ku, Tokyo 1058717, JP
Inventors:
柿下 容弓 KAKISHITA, Yasuki; JP
服部 英春 HATTORI, Hideharu; JP
坂詰 卓 SAKAZUME, Taku; JP
鈴木 洋一郎 SUZUKI, Yohichiroh; JP
Agent:
特許業務法人藤央特許事務所 TOU-OU PATENT FIRM; 東京都港区虎ノ門一丁目16番4号アーバン虎ノ門ビル Urban Toranomon Bldg., 16-4, Toranomon 1-chome, Minato-ku, Tokyo 1050001, JP
Priority Data:
2017-14762931.07.2017JP
Title (EN) DEVICE, SPECIMEN STATE DETERMINATION METHOD, AND ANALYSIS SYSTEM
(FR) DISPOSITIF, PROCÉDÉ DE DÉTERMINATION D'ÉTAT D'ÉCHANTILLON ET SYSTÈME D'ANALYSE
(JA) 装置、試料の状態の判別方法、及び分析システム
Abstract:
(EN) Provided is a device determining a state of a specimen to be analyzed that is contained in a container, wherein the device acquires an image of the specimen, analyzes the position and size of a detection target object with respect to a detection range set in the image by using the image of the specimen, and determines the state of the specimen on the basis of the analyzed result.
(FR) La présente invention concerne un dispositif déterminant un état d'un échantillon à analyser qui est contenu dans un récipient, le dispositif acquérant une image de l'échantillon, analysant la position et la taille d'un objet cible de détection par rapport à une plage de détection définie dans l'image au moyen de l'image de l'échantillon, et déterminant l'état de l'échantillon sur la base du résultat analysé.
(JA) 容器に収められた分析対象の試料の状態を判別する装置であって、装置は、試料の画像を取得し、試料の画像を用いて、画像に設定される検出範囲に対する検出対象物の位置及び大きさを解析し、解析の結果に基づいて試料の状態を判別する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)