Mobile |
Deutsch |
Español |
Français |
日本語 |
한국어 |
Português |
Русский |
中文 |
العربية |
PATENTSCOPE
Search International and National Patent Collections
PATENTSCOPE will be unavailable a few hours for maintenance reason on Monday 18.02.2019 at 12:00 PM CET
Options
Query
Result
Interface
Office
Translate
Query Language
All
Arabic
Bulgarian
Chinese
Danish
English
Estonian
French
German
Hebrew
Indonesian
Italian
Japanese
Korean
Laotian
Polish
Portuguese
Romanian
Russian
Spanish
Swedish
Thai
Vietnamese
Stem
Sort by:
Relevance
Pub Date Desc
Pub Date Asc
App Date Desc
App Date Asc
List Length
10
50
100
200
Result List Language
Query Language
English
Spanish
Korean
Vietnamese
Hebrew
Portuguese
French
German
Japanese
Russian
Chinese
Italian
Polish
Danish
Swedish
Arabic
Estonian
Indonesian
Thai
Bulgarian
Laotian
Romanian
Displayed Fields
Application Number
Publication Date
Abstract
Applicant Name
Int. Class
Image
Inventor Name
Chart/Graph
Table
Graph
Group by
*
None
Offices of NPEs
IPC code
Applicants
Inventors
Filing Dates
Publication Dates
Countries
No of Items/Group
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
Download Fields
NPEs
Default Search Form
Simple
Advanced Search
Field Combination
Browse by Week (PCT)
Cross Lingual Expansion
Translator
Simple
Advanced Search
Field Combination
Browse by Week (PCT)
Cross Lingual Expansion
Translator
Default Tab Search Form
Front Page
Any Field
Full Text
ID/Numbers
IPC
Names
Dates
Front Page
Any Field
Full Text
ID/Numbers
IPC
Names
Dates
Interface Language
English
Deutsch
Français
Español
日本語
中文
한국어
Português
Русский
English
Deutsch
Français
Español
日本語
中文
한국어
Português
Русский
Multiple Windows Interface
Tooltip Help
IPC Tooltip Help
Instant Help
Expanded Query
Office:
All
All
PCT
Africa
African Regional Intellectual Property Organization (ARIPO)
Egypt
Kenya
Morocco
Tunisia
South Africa
Americas
United States of America
Canada
LATIPAT
Argentina
Brazil
Chile
Colombia
Costa Rica
Cuba
Dominican Rep.
Ecuador
El Salvador
Guatemala
Honduras
Mexico
Nicaragua
Panama
Peru
Uruguay
Asia-Europe
Australia
Bahrain
China
Denmark
Estonia
Eurasian Patent Office
European Patent Office (EPO)
France
Germany
Germany(DDR data)
Israel
Japan
Jordan
Portugal
Russian Federation
Russian Federation(USSR data)
Saudi Arabia
United Arab Emirates
Spain
Republic of Korea
India
United Kingdom
Georgia
Bulgaria
Italy
Romania
Lao People's Democratic Republic
Asean
Singapore
Viet Nam
Indonesia
Cambodia
Malaysia
Brunei Darussalam
Philippines
Thailand
WIPO translate (Wipo internal translation tool)
Search
Simple
Advanced Search
Field Combination
Cross Lingual Expansion
Chemical compounds (login required)
Browse
Browse by Week (PCT)
Gazette Archive
National Phase Entries
Full download
Incremental download (last 7 days)
Sequence listing
IPC Green Inventory
Portal to patent registers
Translate
WIPO Translate
WIPO Pearl
News
PATENTSCOPE News
Login
ui-button
Login
Account Sign Up
Options
Options
Help
ui-button
How to Search
User Guide PATENTSCOPE
User Guide: Cross Lingual Expansion
User Guide: ChemSearch
Query Syntax
Fields Definition
Country Code
Data Coverage
PCT applications
PCT national phase entry
National collections
Global Dossier public
FAQ
Feedback&Contact
INID codes
Kind codes
Tutorials
About
Overview
Terms And Conditions
Disclaimer
Home
IP Services
PATENTSCOPE
Machine translation
Wipo Translate
Arabic
German
English
Spanish
French
Japanese
Korean
Portuguese
Russian
Chinese
Google Translate
Bing/Microsoft Translate
Baidu Translate
Arabic
English
French
German
Spanish
Portuguese
Russian
Korean
Japanese
Chinese
...
Italian
Thai
Cantonese
Classical Chinese
Some content of this application is unavailable at the moment.
If this situation persist, please contact us at
Feedback&Contact
1. (WO2019026114) STRUCTURE MEASUREMENT DEVICE, MEASUREMENT POINT CORRECTION DEVICE, AND MEASUREMENT POINT CORRECTION METHOD
PCT Biblio. Data
Full Text
Drawings
National Phase
Notices
Documents
Latest bibliographic data on file with the International Bureau
Submit observation
PermaLink
PermaLink
Bookmark
Pub. No.:
WO/2019/026114
International Application No.:
PCT/JP2017/027657
Publication Date:
07.02.2019
International Filing Date:
31.07.2017
IPC:
G01C 7/04
(2006.01)
G
PHYSICS
01
MEASURING; TESTING
C
MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
7
Tracing profiles
02
of land surfaces
04
involving a vehicle which moves along the profile to be traced
Applicants:
三菱電機株式会社 MITSUBISHI ELECTRIC CORPORATION
[JP/JP]; 東京都千代田区丸の内二丁目7番3号 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310, JP
Inventors:
亀井 克之 KAMEI Katsuyuki
; JP
渡辺 昌志 WATANABE Masashi
; JP
藤林 宏行 FUJIBAYASHI Hiroyuki
; JP
入江 恵 IRIE Megumi
; JP
Agent:
吉竹 英俊 YOSHITAKE Hidetoshi
; JP
有田 貴弘 ARITA Takahiro
; JP
Priority Data:
Title
(EN)
STRUCTURE MEASUREMENT DEVICE, MEASUREMENT POINT CORRECTION DEVICE, AND MEASUREMENT POINT CORRECTION METHOD
(FR)
DISPOSITIF DE MESURE DE STRUCTURE, DISPOSITIF DE CORRECTION DE POINT DE MESURE, ET PROCÉDÉ DE CORRECTION DE POINT DE MESURE
(JA)
構造物計測装置、計測点補正装置、および計測点補正方法
Abstract:
(EN)
According to the present invention, a first measurement surface (26) and a second measurement surface (28) which move with a measuring vehicle (1) are respectively scanned and first measurement coordinate points and second measurement coordinate points are calculated. A first comparison point group and a second comparison point group, which represent comparison portions on the surface of a structure, are respectively extracted from the first measurement coordinate points and the second measurement coordinate points. A difference is calculated between the first comparison point group and the second comparison point group that correspond to measurements of common comparison portions on the surface of the structure. Time-dependent errors included in the first measurement coordinate points and the plurality of second measurement coordinate points are calculated on the basis of the calculated difference. The measurement coordinate points are corrected on the basis of the calculated errors.
(FR)
Selon la présente invention, une première surface de mesure (26) et une seconde surface de mesure (28) qui se déplacent avec un véhicule de mesure (1) sont respectivement balayées et des premiers points de coordonnées de mesure et des seconds points de coordonnées de mesure sont calculés. Un premier groupe de points de comparaison et un second groupe de points de comparaison, qui représentent des parties de comparaison sur la surface d'une structure, sont respectivement extraits des premiers points de coordonnées de mesure et des seconds points de coordonnées de mesure. Une différence est calculée entre le premier groupe de points de comparaison et le second groupe de points de comparaison qui correspondent à des mesures de parties de comparaison communes sur la surface de la structure. Des erreurs dépendantes du temps comprises dans les premiers points de coordonnées de mesure et la pluralité de seconds points de coordonnées de mesure sont calculées sur la base de la différence calculée. Les points de coordonnées de mesure sont corrigés sur la base des erreurs calculées.
(JA)
計測車両(1)と共に移動する第1の計測面(26)および第2の計測面(28)内のそれぞれが走査され、第1の計測座標点および第2の計測座標点が算出される。第1の計測座標点および第2の計測座標点のそれぞれから、構造物の表面のうち比較部分を表す第1の比較点群および第2の比較点群が抽出される。構造物の表面上の共通の比較部分の計測に対応する第1の比較点群と第2の比較点群との間の差異が算出される。算出された差異に基づいて、第1の計測座標点および複数の第2の計測座標点に含まれる時間依存性の誤差が算出される。算出された誤差に基づいて計測座標点が補正される。
Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language:
Japanese (
JA
)
Filing Language:
Japanese (
JA
)