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1. (WO2019009603) DEVICE AND METHOD FOR INSPECTING TOUCH SENSOR
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Pub. No.: WO/2019/009603 International Application No.: PCT/KR2018/007553
Publication Date: 10.01.2019 International Filing Date: 04.07.2018
IPC:
G01R 31/28 (2006.01) ,G06F 3/041 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
3
Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
01
Input arrangements or combined input and output arrangements for interaction between user and computer
03
Arrangements for converting the position or the displacement of a member into a coded form
041
Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
Applicants:
동우 화인켐 주식회사 DONGWOO FINE-CHEM CO., LTD. [KR/KR]; 전라북도 익산시 약촌로 132 132, Yakchon-ro Iksan-si, Jeollabuk-do 54631, KR
Inventors:
김종우 KIM, Jong Woo; KR
이태규 LEE, Tae Kyu; KR
전주병 JEON, Joo Byung; KR
이한배 LEE, Han Bae; KR
Agent:
특허법인 다래 DARAE IP FIRM; 서울시 강남구 테헤란로 132, 10층 (역삼동, 한독타워) (Handok Tower, Yeoksam-dong) 10th Floor, 132, Teheran-ro Gangnam-gu, Seoul 06235, KR
Priority Data:
10-2017-008600406.07.2017KR
Title (EN) DEVICE AND METHOD FOR INSPECTING TOUCH SENSOR
(FR) DISPOSITIF ET PROCÉDÉ D'INSPECTION D'UN CAPTEUR TACTILE
(KO) 터치 센서 검사 장치 및 방법
Abstract:
(EN) The present invention relates to a device and a method for inspecting a touch sensor. The present invention comprises: a stage on which a touch sensor, which includes a bonding pad part bonded to a first contact part of an FPCB and a sensing part electrically connected to the bonding pad part, is arranged; a lower inspection block provided at a position lower than that of the stage and bonded to a second contact part of the FPCB; an upper press block for pressing the lower inspection block bonded to the second contact part of the FPCB; and a rail guide part for providing a path along which the lower inspection block pressed by the upper press block moves toward the stage. According to the present invention, whether fine cracks that can cause a product defect are present in the bonding pad part of the touch sensor can be checked through simple and quick electrical inspection without performing an optical inspection.
(FR) La présente invention concerne un dispositif et un procédé d'inspection d'un capteur tactile. La présente invention comprend : un étage sur lequel est placé un capteur tactile, qui comprend une partie plot de connexion fixée à une première partie de contact d'une FPCB et une partie de détection connectée électriquement à la partie plot de connexion ; un bloc d'inspection inférieur prévu à une position inférieure à celle de l'étage et fixé à une seconde partie de contact de la FPCB ; un bloc de presse supérieur permettant de presser le bloc d'inspection inférieur fixé à la seconde partie de contact de la FPCB ; et une partie de guidage de rail permettant de fournir un trajet le long duquel le bloc d'inspection inférieur pressé par le bloc de presse supérieur se déplace vers l'étage. La présente invention permet de vérifier si des fissures fines qui peuvent provoquer un défaut de produit sont présentes dans la partie plot de connexion du capteur tactile par une inspection électrique simple et rapide sans réaliser d'inspection optique.
(KO) 본 발명은 터치 센서 검사 장치 및 방법에 관한 것이다. 본 발명은 FPCB의 제1 접촉부에 접착된 본딩 패드부 및 상기 본딩 패드부에 전기적으로 연결된 센싱부를 포함하는 터치 센서가 배치되는 스테이지, 상기 스테이지보다 낮은 위치에 구비되며 상기 FPCB의 제2 접촉부에 접착된 하부 검사 블록, 상기 FPCB의 제2 접촉부에 접착된 하부 검사 블록을 누르는 상부 누름 블록 및 상기 상부 누름 블록에 의해 눌러진 하부 검사 블록이 상기 스테이지를 향하여 이동하는 경로를 제공하는 레일 가이드부를 포함한다. 본 발명에 따르면, 터치 센서의 본딩 패드부에 제품 불량으로 이어질 수 있는 미세 크랙이 존재하는지 여부를 광학 검사를 수행하지 않고도 단순하고 신속한 전기적 검사를 통해 확인할 수 있다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)