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1. (WO2019004663) PROBE MEMBER FOR POGO PIN, MANUFACTURING METHOD THEREFOR AND POGO PIN COMPRISING SAME
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Pub. No.: WO/2019/004663 International Application No.: PCT/KR2018/007089
Publication Date: 03.01.2019 International Filing Date: 22.06.2018
IPC:
G01R 1/067 (2006.01) ,G01R 3/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
3
Apparatus or processes specially adapted for the manufacture of measuring instruments
Applicants:
주식회사 아이에스시 ISC CO., LTD. [KR/KR]; 경기도 성남시 중원구 갈마치로 215, 6층 6F, 215, Galmachi-ro, Jungwon-gu, Seongnam-si, Gyeonggi-do 13217, KR
Inventors:
정영배 CHUNG, Young Bae; KR
Agent:
리앤목 특허법인 Y.P.LEE, MOCK & PARTNERS; 서울시 강남구 언주로 30길 13 대림아크로텔 12층 12F Daerim Acrotel, 13 Eonju-ro 30-gil Gangnam-gu Seoul 06292, KR
Priority Data:
10-2017-008174628.06.2017KR
Title (EN) PROBE MEMBER FOR POGO PIN, MANUFACTURING METHOD THEREFOR AND POGO PIN COMPRISING SAME
(FR) ÉLÉMENT DE SONDE POUR BROCHE POGO, SON PROCÉDÉ DE FABRICATION ET BROCHE POGO LE COMPRENANT
(KO) 포고핀용 탐침부재, 이의 제조 방법 및 이를 포함하는 포고핀
Abstract:
(EN) The present invention relates to a probe member for a pogo pin, a manufacturing method therefor and a pogo pin comprising same. One embodiment of the present invention provides a probe member used in a test socket, the probe member comprising: at least one contact part having one end formed so as to be sharp and making contact with an object being inspected; a polygonal or cylindrical first body part having the other end of the contact part coupling to one end thereof; and a polygonal or cylindrical second body part having the other end of the first body part coupling to one end thereof, wherein the contact part is formed from a material having a greater hardness compared to the first body part and the second body part, and the first body part and the second body part are formed from a material exhibiting an electrical conductivity of at least 50% IACS (International Annealed Copper Standard), and at least one portion thereof are inserted in a pipe having an inner space formed therein.
(FR) La présente invention concerne un élément de sonde pour broche pogo, son procédé de fabrication et une broche pogo le comprenant. Un mode de réalisation de la présente invention concerne un élément de sonde utilisé dans une douille d'essai, l'élément de sonde comprenant : au moins une partie de contact ayant une extrémité formée de sorte à être pointue et à entrer en contact avec un objet inspecté ; une première partie de corps polygonal ou cylindrique dont une extrémité est couplée à l'autre extrémité de la partie de contact ; et une seconde partie de corps polygonal ou cylindrique dont une extrémité est couplée à l'autre extrémité de la première partie de corps, la partie de contact étant constituée d'un matériau ayant une dureté supérieure par rapport à la première partie de corps et à la seconde partie de corps, et la première partie de corps et la seconde partie de corps étant constituées d'un matériau présentant une conductivité électrique supérieure ou égale à 50 % IACS (norme internationale de cuivre recuit), et au moins une partie de celles-ci étant insérée dans un tuyau au sein duquel est formé un espace interne.
(KO) 본 발명은 포고핀용 탐침부재, 이의 제조 방법 및 이를 포함하는 포고핀에 관한 것이다. 본 발명의 일 실시예는 일단이 뾰족하게 형성되며, 피검사체와 접촉되는 하나 이상의 접촉부와, 일단에 접촉부의 타단이 결합되며, 다각형 또는 원형기둥형상을 가진 제1몸체부와, 일단에 제1몸체부의 타단이 결합되며, 다각형 또는 원형 기둥형상을 가진 제2몸체부를 포함하며, 접촉부는 제1몸체부 및 제2몸체부에 비해 높은 경도를 갖는 소재로 이루어지고, 제1몸체부 및 제2몸체부는 50% IACS(International Annealed Copper Standard) 이상의 전기전도율을 갖는 소재로 이루어지며, 적어도 일부가 내부공간이 형성된 파이프 내에 삽입되어, 테스트 소켓에 사용되는 탐침부재를 제공한다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)