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1. (WO2019004161) SILICA SLURRY FOR POLISHING-LIQUID COMPOSITION
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Pub. No.: WO/2019/004161 International Application No.: PCT/JP2018/024104
Publication Date: 03.01.2019 International Filing Date: 26.06.2018
IPC:
C09K 3/14 (2006.01) ,B24B 37/00 (2012.01) ,G11B 5/84 (2006.01)
C CHEMISTRY; METALLURGY
09
DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
K
MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
3
Materials not provided for elsewhere
14
Anti-slip materials; Abrasives
B PERFORMING OPERATIONS; TRANSPORTING
24
GRINDING; POLISHING
B
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
37
Lapping machines or devices; Accessories
G PHYSICS
11
INFORMATION STORAGE
B
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
5
Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
84
Processes or apparatus specially adapted for manufacturing record carriers
Applicants:
花王株式会社 KAO CORPORATION [JP/JP]; 東京都中央区日本橋茅場町一丁目１４番１０号 14-10, Nihonbashi Kayabacho 1-chome, Chuo-ku, Tokyo 1038210, JP
Inventors:
木村陽介 KIMURA Yosuke; --
Agent:
特許業務法人池内アンドパートナーズ IKEUCHI & PARTNERS; 大阪府大阪市北区天満橋１丁目８番３０号ＯＡＰタワー２６階 26th Floor, OAP TOWER, 8-30, Tenmabashi 1-chome, Kita-ku, Osaka-shi, Osaka 5306026, JP
Priority Data:
2017-12447426.06.2017JP
2018-11953625.06.2018JP
Title (EN) SILICA SLURRY FOR POLISHING-LIQUID COMPOSITION
(FR) SUSPENSION DE SILICE POUR COMPOSITION LIQUIDE DE POLISSAGE
(JA) 研磨液組成物用シリカスラリー
Abstract:
(EN) One embodiment of the present invention is a silica slurry for a polishing-liquid composition, said slurry comprising silica particles, a redispersion aid and water, the redispersion aid being an alkali thickening polymer emulsion, and the pH of said silica slurry being 8.0–12.0, inclusive, at 25°C. The average secondary particle size of the silica particles is preferably 150–580nm, inclusive. The silica slurry for a polishing-liquid composition preferably has a viscosity of no less than 20mPa·s at 25°C. When an acid or an oxidising agent is added to adjust the pH to 0.5–6.0, inclusive, the viscosity is preferably no more than 10mPa·s at 25°C.
(FR) Un mode de réalisation de la présente invention concerne une suspension de silice pour une composition liquide de polissage, ladite suspension comprenant des particules de silice, un auxiliaire de redispersion et de l'eau, l'auxiliaire de redispersion étant une émulsion de polymère épaississant alcalin, et le pH de ladite suspension de silice étant compris entre 8,0 et 12,0, inclus, à 25 °C. La taille de particule secondaire moyenne des particules de silice est de préférence comprise entre 150 et 580 nm, inclus. La suspension de silice pour composition de liquide de polissage présente de préférence une viscosité supérieure ou égale à 20 mPa·s à 25 °C. Lorsqu'un acide ou un agent oxydant est ajouté pour ajuster le pH entre 0,5 et 6,0, inclus, la viscosité n'est de préférence pas supérieure à 10 mPa·s à 25° C.
(JA) 本発明の一態様は、シリカ粒子、再分散性向上剤、及び水を含み、再分散性向上剤が、アルカリ増粘型ポリマーエマルジョンであり、２５℃におけるｐＨが８．０以上１２．０以下である、研磨液組成物用シリカスラリーである。シリカ粒子の平均二次粒子径は、好ましくは１５０ｎｍ以上５８０ｎｍ以下である。研磨液組成物用シリカスラリーの２５℃における粘度は、好ましくは２０ｍＰａ・ｓ以上である。酸又は酸化剤を添加してｐＨを０．５以上６．０以下とした場合に、２５℃における粘度は、好ましくは１０ｍＰａ・ｓ以下となる。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)