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1. (WO2018235186) APPARATUS FOR PERFORMING WORK ON SUBSTRATE
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Pub. No.:
WO/2018/235186
International Application No.:
PCT/JP2017/022841
Publication Date:
27.12.2018
International Filing Date:
21.06.2017
IPC:
H05K 13/08
(2006.01)
H
ELECTRICITY
05
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
K
PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
13
Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
08
Monitoring manufacture of assemblages
Applicants:
株式会社FUJI FUJI CORPORATION
[JP/JP]; 愛知県知立市山町茶碓山19番地 19, Chausuyama, Yamamachi, Chiryu-shi, Aichi 4728686, JP
Inventors:
天野 雅史 AMANO, Masafumi
; JP
大池 博史 OIKE, Hiroshi
; JP
小谷 一也 KOTANI, Kazuya
; JP
Agent:
加古 宗男 KAKO, Muneo
; JP
Priority Data:
Title
(EN)
APPARATUS FOR PERFORMING WORK ON SUBSTRATE
(FR)
APPAREIL DE CONDUITE DE TRAVAIL SUR UN SUBSTRAT
(JA)
対基板作業装置
Abstract:
(EN)
This apparatus for performing work on a substrate (pick and place machine) is equipped with an image processing device (control device 31) wherein imaging is performed multiple times while a moving device (25) causes a camera (36) to move within such a range that a reference marking (identification target) on a circuit base board (13) falls within the field-of-view of the camera, thereby acquiring a plurality of images that have been imaged at different positions, and, via multi-frame super resolution processing, producing a super resolution image to identify the reference marking. After completing the initial imaging, this imaging device executes, in parallel to the operation of moving the camera to the next imaging position, candidate region search processing wherein the initially imaged image is processed, and, within the image, at least one region that may contain a section with a reference marking is searched as a candidate region. After completing the final imaging, this imaging device uses the plurality of images to execute multi-frame super resolution processing on the candidate regions found by the candidate region search processing, producing a super resolution image of the candidate region to identify the reference marking.
(FR)
La présente invention concerne un appareil de conduite de travail sur un substrat (machine de saisie et de placement) qui est équipé d’un dispositif de traitement d’images (dispositif de contrôle (31)) grâce auquel l’imagerie est effectuée plusieurs fois lorsqu’un dispositif mobile (25) entraîne le mouvement d’une caméra (36) dans une plage telle qu’un marquage de référence (cible d’identification) sur une carte de base de circuit (13) tombe dans le champ de vision de la caméra, acquérant ainsi une pluralité d’images qui ont été imagées à des positions différentes, et, par traitement à super-résolution multitrame, produisant une image à super-résolution pour identifier le marquage de référence. Après avoir terminé l’imagerie initiale, ce dispositif imageur exécute, en parallèle à l’opération de déplacement de la caméra vers la position d’imagerie suivante, un traitement de recherche de zone candidate selon lequel l’image imagée initialement est traitée, et, dans l’image, au moins une zone qui peut contenir une section comportant un marquage de référence est recherchée comme zone candidate. Après avoir terminé l’imagerie finale, ce dispositif imageur utilise la pluralité d’images pour exécuter un traitement à super-résolution multitrame sur les zones candidates trouvées par le traitement de recherche de zone candidate, produisant une image à super-résolution de la zone candidate pour identifier le marquage de référence.
(JA)
対基板作業装置(部品実装機)は、移動装置(25)によりカメラ(36)の視野内に回路基板(13)の基準マーク(認識対象)が収まる範囲内で当該カメラを移動させて複数回撮像することで異なる位置で撮像した複数枚の画像を取得してマルチフレーム超解像処理により超解像画像を作成して基準マークを認識する画像処理装置(制御装置31)を備える。この画像処理装置は、最初に撮像した画像を処理して当該画像内で基準マークの可能性のある部分を含む少なくとも1つの領域を候補領域として探索する候補領域探索処理を、最初の撮像終了後にカメラを次の撮像位置へ移動させる動作と並行して実行し、最後の撮像終了後に前記複数枚の画像を用いて前記候補領域探索処理で探索された候補領域に対してマルチフレーム超解像処理を実行して当該候補領域の超解像画像を作成して基準マークを認識する。
Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language:
Japanese (
JA
)
Filing Language:
Japanese (
JA
)