Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018225382) CELL STATE ANALYSIS DEVICE AND ANALYSIS METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/225382 International Application No.: PCT/JP2018/015523
Publication Date: 13.12.2018 International Filing Date: 13.04.2018
IPC:
G01N 21/17 (2006.01) ,G02B 21/00 (2006.01) ,G02B 21/06 (2006.01) ,G02B 21/34 (2006.01) ,G02B 21/36 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
06
Means for illuminating specimen
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
34
Microscope slides, e.g. mounting specimens on microscope slides
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
21
Microscopes
36
arranged for photographic purposes or projection purposes
Applicants:
株式会社日立ハイテクノロジーズ HITACHI HIGH-TECHNOLOGIES CORPORATION [JP/JP]; 東京都港区西新橋一丁目24番14号 24-14, Nishi Shimbashi 1-chome, Minato-ku, Tokyo 1058717, JP
Inventors:
千田 直子 SENDA Naoko; JP
大澤 賢太郎 OSAWA Kentaro; JP
Agent:
特許業務法人平木国際特許事務所 HIRAKI & ASSOCIATES; 東京都港区愛宕二丁目5-1 愛宕グリーンヒルズMORIタワー32階 Atago Green Hills MORI Tower 32F, 5-1, Atago 2-chome, Minato-ku, Tokyo 1056232, JP
Priority Data:
2017-11454609.06.2017JP
Title (EN) CELL STATE ANALYSIS DEVICE AND ANALYSIS METHOD
(FR) DISPOSITIF ET PROCÉDÉ D’ANALYSE D'ÉTAT DE CELLULE
(JA) 細胞状態の解析装置および解析方法
Abstract:
(EN) This cell state analysis method is characterized by comprising: a step for irradiating light from a light source onto a sample; a step that is for acquiring a plurality of tomographic sample images of different distances from a light irradiation position and in which (a) for distances from the light irradiation position exceeding the penetration depth limit of the light, the central part of the light beam of the light from the light source is blocked by a light blocking part and tomographic sample images are acquired through the reflection of the blocked light from a reflection surface and (b) for distances from the light irradiation position up to the penetration depth limit of the light, tomographic sample images are acquired without using the reflection surface; and a step for analyzing the cell state of the sample on the basis of the acquired images.
(FR) L'invention concerne un procédé d'analyse d'état de cellule caractérisé en ce qu'il comprend : une étape d'irradiation de lumière à partir d'une source de lumière sur un échantillon ; une étape d'acquisition d'une pluralité d'images d'échantillon tomographique de différentes distances à partir d'une position d'irradiation de lumière et dans laquelle (a) pour des distances à partir de la position d'irradiation de lumière dépassant la limite de profondeur de pénétration de la lumière, la partie centrale du faisceau lumineux de la lumière provenant de la source de lumière est bloquée par une partie de blocage de lumière et des images d'échantillon tomographique sont acquises par réflexion de la lumière bloquée à partir d'une surface de réflexion et (b) pour des distances de la position d'irradiation de lumière jusqu'à la limite de profondeur de pénétration de la lumière, des images d'échantillon tomographique sont acquises sans utiliser la surface de réflexion ; et une étape pour analyser l'état de cellule de l'échantillon sur la base des images acquises.
(JA) 光源からサンプルに光を照射する工程;光照射位置からの距離が異なる複数のサンプル断層画像を取得する工程であって、(a)前記光照射位置からの距離が光の侵達深さ限界を超える距離では、前記光源からの光の光束中心部を遮光部により遮光し、遮光された光を反射面で反射させてサンプル断層画像を取得し、(b)前記光照射位置からの距離が光の侵達深さ限界までの距離では、前記反射面を用いないでサンプル断層画像を取得する、工程;取得した画像に基づいてサンプルの細胞状態を解析する工程を含むことを特徴とする細胞状態の解析方法。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)