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1. (WO2018223865) CIRCUIT WORKING STATE TESTING METHOD AND TESTING DEVICE
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Pub. No.: WO/2018/223865 International Application No.: PCT/CN2018/088745
Publication Date: 13.12.2018 International Filing Date: 28.05.2018
IPC:
G01R 31/28 (2006.01) ,G01R 31/317 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
Applicants:
京东方科技集团股份有限公司 BOE TECHNOLOGY GROUP CO., LTD. [CN/CN]; 中国北京市 朝阳区酒仙桥路10号 No.10 Jiuxianqiao Rd., Chaoyang District Beijing 100015, CN
鄂尔多斯市源盛光电有限责任公司 ORDOS YUANSHENG OPTOELECTRONICS CO., LTD. [CN/CN]; 中国内蒙古自治区鄂尔多斯市 东胜区鄂尔多斯装备制造基地 Ordos Equipment Manufacturing Base, Dongsheng District Ordos, Inner Mongolia 017020, CN
Inventors:
毕海峰 BI, Haifeng; CN
唐乌力吉白尔 TANG, Wulijibaier; CN
连龙 LIAN, Long; CN
王晓杰 WANG, Xiaojie; CN
郝瑞军 HAO, Ruijun; CN
Agent:
北京市柳沈律师事务所 LIU, SHEN & ASSOCIATES; 中国北京市 海淀区彩和坊路10号1号楼10层 10th Floor, Building 1, 10 Caihefang Road, Haidian District Beijing 100080, CN
Priority Data:
201710429375.308.06.2017CN
Title (EN) CIRCUIT WORKING STATE TESTING METHOD AND TESTING DEVICE
(FR) PROCÉDÉ DE TEST ET DISPOSITIF DE TEST D'ÉTAT DE TRAVAIL DE CIRCUIT
(ZH) 一种电路的工作状态的检测方法及检测装置
Abstract:
(EN) Provided are a circuit working state testing method and testing device, the method comprising : forming a neural network acquiring a state type of a circuit to be tested (S1); measuring electrical property parameters of at least one node in the circuit to be tested (S2); and inputting the measured electrical property parameters of at least one node into the neural network, and obtaining, via the neural network, the state type of the circuit to be tested (S3).
(FR) L'invention concerne un procédé de test et un dispositif de test d'état de travail de circuit, le procédé comprenant : la formation d'un réseau neuronal acquérant un type d'état d'un circuit devant être testé (S1); la mesure de paramètres de propriétés électriques d'au moins un nœud dans le circuit devant être testé (S2); et l'entrée des paramètres de propriétés électriques mesurés d'au moins un nœud dans le réseau neuronal et l'obtention, via le réseau neuronal, du type d'état du circuit devant être testé (S3).
(ZH) 一种电路的工作状态的检测方法及检测装置,所述方法包括:形成获取待测电路的状态类别的神经网络(S1);测量待测电路中至少一个节点的电学特性参数(S2);将所测量的至少一个节点的电学特性参数输入神经网络,通过神经网络得到待测电路的状态类别(S3)。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Chinese (ZH)
Filing Language: Chinese (ZH)