Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018221718) BEST SOLUTION CALCULATION METHOD AND DOMINANT SOLUTION CALCULATION METHOD FOR CALCULATION PARAMETER IN POWDER DIFFRACTION PATTERN, AND PROGRAM THEREOF
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/221718 International Application No.: PCT/JP2018/021153
Publication Date: 06.12.2018 International Filing Date: 01.06.2018
IPC:
G01N 23/207 (2018.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
20
by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
207
by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
Applicants:
株式会社フィゾニット PHYSONIT INC. [JP/JP]; 広島県安芸郡海田町南堀川町6番10号4F 6-10-4F, Minami-Horikawa-machi, Kaita-cho, Aki-gun, Hiroshima 7360044, JP
Inventors:
坪田 雅己 TSUBOTA Masami; JP
Agent:
松本文彦 MATSUMOTO Fumihiko; JP
Priority Data:
2017-11050002.06.2017JP
Title (EN) BEST SOLUTION CALCULATION METHOD AND DOMINANT SOLUTION CALCULATION METHOD FOR CALCULATION PARAMETER IN POWDER DIFFRACTION PATTERN, AND PROGRAM THEREOF
(FR) PROCÉDÉ DE CALCUL DE MEILLEURE SOLUTION ET PROCÉDÉ DE CALCUL DE SOLUTION DOMINANTE POUR UN PARAMÈTRE DE CALCUL DANS UN DIAGRAMME DE DIFFRACTION SUR POUDRE, ET PROGRAMME ASSOCIÉ
(JA) 粉末回折パターンにおける計算パラメータの最善解算出方法,優位解算出方法,及びそのプログラム
Abstract:
(EN) Provided is a method which is capable of calculating a calculation parameter with high accuracy from an observation diffraction pattern of a powder sample. A best solution calculation method for a calculation parameter in an observation diffraction pattern used for crystal structure analysis of a powder sample is provide with: a third convergence value calculation process (600) which calculates each of at least three convergence values; a third best solution determination process (700) which calculates adaptabilities and determines whether each of the at least three calculated convergence values is a true solution by using respective peak position shift parameters of the at least three calculated convergence values; and a first global solution calculation process (800) which calculates a global solution that is the true solution by using each of the obtained adaptabilities.
(FR) La présente invention concerne un procédé qui est capable de calculer un paramètre de calcul avec une précision élevée à partir d'un diagramme de diffraction d'observation d'un échantillon de poudre. Un procédé de calcul de meilleure solution pour un paramètre de calcul dans un motif de diffraction d'observation utilisé pour l'analyse de structure cristalline d'un échantillon de poudre comprend : un troisième processus de calcul de valeur de convergence (600) qui calcule chacune d'au moins trois valeurs de convergence; un troisième processus de détermination de meilleure solution (700) qui calcule des adaptabilités et détermine si chacune des au moins trois valeurs de convergence calculées est une solution vraie en utilisant des paramètres de décalage de position de pic respectifs des au moins trois valeurs de convergence calculées; et un premier processus de calcul de solution globale (800) qui calcule une solution globale qui est la solution vraie en utilisant chacune des adaptabilités obtenues.
(JA) 粉末試料の観測回折パターンから計算パラメータを高確度で算出できる方法を提供する。 粉末試料の結晶構造解析に用いられる観測回折パターンにおける計算パラメータの最善解算出方法であって,少なくとも三つの収束値をそれぞれ算出する第三収束値算出工程(600)と,算出された少なくとも三つの収束値のうちそれぞれピーク位置シフトパラメータを用いて適合度を算出し,真の解であるか否かを判定する第三最善解判定工程(700)と,得られた適合度のそれぞれを用いて真の解である大局解を算出する第一大局解算出工程(800)と,を備える。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)