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1. (WO2018221006) SURFACE DEFECT INSPECTION DEVICE AND METHOD

Pub. No.:    WO/2018/221006    International Application No.:    PCT/JP2018/014684
Publication Date: Fri Dec 07 00:59:59 CET 2018 International Filing Date: Sat Apr 07 01:59:59 CEST 2018
IPC: G01N 21/88
G01B 11/30
G06T 7/00
Applicants: KONICA MINOLTA, INC.
コニカミノルタ株式会社
Inventors: HARADA, Koji
原田 孝仁
KASHIHARA, Masato
柏原 将人
WAKIMURA, Taizo
脇村 泰三
Title: SURFACE DEFECT INSPECTION DEVICE AND METHOD
Abstract:
According to this surface defect inspection device and surface defect inspection method, illumination light is radiated at an inspection surface of an inspection target, and defects in the inspection surface are detected on the basis of an image captured of the inspection surface. The illumination light is radiated to form at least one bright region—dark region set, and, during the detection of defects in the inspection surface, the area of a defect detection image region that is for detecting defects and is set in an image that has been taken of the inspection surface as irradiated with the illumination light in the bright region is adjusted in accordance with a predefined degree of visibility for orange peel.