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1. (WO2018205348) HIGH-TEMPERATURE TESTING DEVICE AND HIGH-TEMPERATURE TESTING SYSTEM

Pub. No.:    WO/2018/205348    International Application No.:    PCT/CN2017/088680
Publication Date: Fri Nov 16 00:59:59 CET 2018 International Filing Date: Sat Jun 17 01:59:59 CEST 2017
IPC: G01R 31/00
Applicants: HKC CORPORATION LIMITED
惠科股份有限公司
CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CO. ,LTD.
重庆惠科金渝光电科技有限公司
Inventors: HO, Cheng-Hang
何政航
Title: HIGH-TEMPERATURE TESTING DEVICE AND HIGH-TEMPERATURE TESTING SYSTEM
Abstract:
A high-temperature testing device (10), comprising trolleys (20), furnaces (30), and doors (40). Each trolley (20) comprises a base (21) and a display panel placing area (22) disposed on the base (21); the base (21) comprises a supporting table (211) and a boss (212) which is vertically formed in the upper surface of the supporting table (211); the display panel placing area (22) is disposed on the boss (212); a power supply device and a signal generator are both disposed in the supporting table (211); a receiving cavity for matching and receiving a trolley (20) is formed in the furnace (30); two opposite inner sidewalls in the furnace (30) are formed with a first heat insulating plate (31) and a second heat insulating plate (32); a gap allowing the trolley (212) to pass through is provided between opposite end portions of the first heat insulating plate (31) and the second heat insulating plate (32); after the trolley (20) is placed in the furnace (30), the boss (212) abuts against the first heat insulating plate (31 and the second insulating plate (32)) at the same time, and is in matching engagement in the gap; a door (40) is movably provided on the furnace (30), and covers the furnace (30) in matched fashion.