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1. (WO2018203562) SLIT LAMP MICROSCOPE

Pub. No.:    WO/2018/203562    International Application No.:    PCT/JP2018/017455
Publication Date: Fri Nov 09 00:59:59 CET 2018 International Filing Date: Wed May 02 01:59:59 CEST 2018
IPC: A61B 3/135
Applicants: TOPCON CORPORATION
株式会社トプコン
Inventors: SHIMIZU Hitoshi
清水 仁
Title: SLIT LAMP MICROSCOPE
Abstract:
[Problem] To provide a slit lamp microscope capable of improving test precision without burdening a subject. [Solution] A slit lamp microscope comprising: an illumination system that has a light source for outputting illumination light, and shines, upon a subject eye, observation light of limited area by passing the illumination light through a beam controlling part, the area of an opening of which can be altered; an observational system for observing observation light returning from the subject eye; and a control unit for controlling at least the operation of the illumination system; the microscope comprising a slit opening area detector for detecting the area of the opening; and the control unit controlling the intensity of the light source on the basis of the opening area detected by the opening area detector.