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1. (WO2018200595) FORCE MICROSCOPE WITH HELIUM ATMOSPHERE
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Pub. No.: WO/2018/200595 International Application No.: PCT/US2018/029232
Publication Date: 01.11.2018 International Filing Date: 24.04.2018
IPC:
G01Q 30/08 (2010.01)
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
30
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08
Means for establishing or regulating a desired environmental condition within a sample chamber
Applicants:
MOLECULAR VISTA, INC. [US/US]; 6840 Via Del Oro Suite 110 San Jose, CA 95119, US
Inventors:
ALBRECHT, Thomas, R.; US
Agent:
HAM, Thomas, H.; US
Priority Data:
62/489,37424.04.2017US
Title (EN) FORCE MICROSCOPE WITH HELIUM ATMOSPHERE
(FR) MICROSCOPE À FORCE AVEC ATMOSPHÈRE D'HÉLIUM
Abstract:
(EN) A scanning force microscope and method for operating the scanning force microscope uses an enclosed chamber to create a reduced damping environment with a damping-reducing gas at a pressure below one atmospheric pressure to engage a sample of interest.
(FR) L'invention concerne un microscope à force atomique et un procédé de fonctionnement du microscope à force de atomique mettent en oeuvre une chambre fermée pour créer un environnement d'amortissement réduit avec un gaz réducteur d'amortissement à une pression inférieure à une pression atmosphérique pour de coopérer avec un échantillon d'intérêt.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)