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1. (WO2018200092) SACRIFICIAL TEST PADS FOR INLINE TEST ACCESS

Pub. No.:    WO/2018/200092    International Application No.:    PCT/US2018/022712
Publication Date: Fri Nov 02 00:59:59 CET 2018 International Filing Date: Fri Mar 16 00:59:59 CET 2018
IPC: H01L 21/66
H01L 23/00
Applicants: QUALCOMM INCORPORATED
Inventors: CASSIER, Amer Christophe
PAYNTER, Charles
Title: SACRIFICIAL TEST PADS FOR INLINE TEST ACCESS
Abstract:
A chip assembly (700) includes a first die pad (710) on a first side of the chip assembly, the first side obscured and inaccessible during testing of the chip assembly. The chip assembly also includes a second die pad (708) on a second side of the chip assembly, opposite the first side. The chip assembly further includes a portion of a sacrificial test pad (714) on a sidewall of the chip assembly and electrically connected to the first die pad.