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1. (WO2018199933) DETERMINING A CHARACTERISTIC OF A SUBSTRATE

Pub. No.:    WO/2018/199933    International Application No.:    PCT/US2017/029402
Publication Date: Fri Nov 02 00:59:59 CET 2018 International Filing Date: Wed Apr 26 01:59:59 CEST 2017
IPC: G01N 21/86
G01B 11/00
Applicants: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
Inventors: MOROVIC, Peter
MOROVIC, Jan
GOMEZ MINANO, Hector
CASALDALIGA ALBISU, Marcos
COLL SICLUNA, Joan Jordi
Title: DETERMINING A CHARACTERISTIC OF A SUBSTRATE
Abstract:
A method is described in which a reflection is obtained of a laser light pattern reflected from a substrate. A reflection of diffuse light may be obtained from the substrate. A first parameter may be determined, relating to the substrate from the reflected laser light pattern. A second parameter may be determined, relating to the substrate from the reflected diffuse light and a characteristic of the substrate may be determined from the first and second parameters. A print apparatus and a machine-readable medium are also disclosed.