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1. (WO2018199076) CLEARANCE MEASUREMENT DEVICE, CLEARANCE MEASUREMENT SENSOR, AND CLEARANCE MEASUREMENT METHOD
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Pub. No.: WO/2018/199076 International Application No.: PCT/JP2018/016574
Publication Date: 01.11.2018 International Filing Date: 24.04.2018
IPC:
G01B 11/14 (2006.01) ,F01D 25/00 (2006.01) ,F02C 7/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
14
for measuring distance or clearance between spaced objects or spaced apertures
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
01
MACHINES OR ENGINES IN GENERAL; ENGINE PLANTS IN GENERAL; STEAM ENGINES
D
NON-POSITIVE-DISPLACEMENT MACHINES OR ENGINES, e.g. STEAM TURBINES
25
Component parts, details, or accessories, not provided for in, or of interest apart from, other groups
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
02
COMBUSTION ENGINES; HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
C
GAS-TURBINE PLANTS; AIR INTAKES FOR JET-PROPULSION PLANTS; CONTROLLING FUEL SUPPLY IN AIR-BREATHING JET-PROPULSION PLANTS
7
Features, component parts, details or accessories, not provided for in, or of interest apart from, groups F02C1/-F02C6/158; Air intakes for jet-propulsion plants
Applicants:
三菱重工業株式会社 MITSUBISHI HEAVY INDUSTRIES, LTD. [JP/JP]; 東京都港区港南二丁目16番5号 16-5, Konan 2-Chome, Minato-ku, Tokyo 1088215, JP
Inventors:
福山 美咲 FUKUYAMA, Misaki; JP
近藤 明生 KONDOU, Akio; JP
大西 智之 ONISHI, Tomoyuki; JP
宮本 貴洋 MIYAMOTO, Takahiro; JP
Agent:
誠真IP特許業務法人 SEISHIN IP PATENT FIRM, P.C.; 東京都港区三田三丁目13番16号 三田43MTビル13階 Mita 43MT Building 13th Floor, 13-16, Mita 3-Chome, Minato-ku, Tokyo 1080073, JP
Priority Data:
2017-08622225.04.2017JP
Title (EN) CLEARANCE MEASUREMENT DEVICE, CLEARANCE MEASUREMENT SENSOR, AND CLEARANCE MEASUREMENT METHOD
(FR) DISPOSITIF DE MESURE DE JEU, CAPTEUR DE MESURE DE JEU ET PROCÉDÉ DE MESURE DE JEU
(JA) クリアランス計測装置、クリアランス計測センサ及びクリアランス計測方法
Abstract:
(EN) Provided is a clearance measurement device, which is a device for measuring the clearance between the inner peripheral surface of a casing and the outer peripheral surface of a rotary body. The device emits light having a first wavelength and light having a second wavelength toward the outer peripheral surface of the rotating body, receives reflected light from the outer peripheral surface via a first filter having a transmission band corresponding to the first wavelength, receives light via a second filter having a transmission band corresponding to the second wavelength, and measures the clearance on the basis of a time difference of the detection timing of the rotating body.
(FR) L'invention concerne un dispositif de mesure de jeu, étant un dispositif pour mesurer le jeu entre la surface périphérique interne d'un boîtier et la surface périphérique externe d'un corps rotatif. Le dispositif émet une lumière ayant une première longueur d'onde et une lumière ayant une seconde longueur d'onde vers la surface périphérique externe du corps rotatif, reçoit une lumière réfléchie à partir de la surface périphérique externe par l'intermédiaire d'un premier filtre ayant une bande de transmission correspondant à la première longueur d'onde, reçoit de la lumière par l'intermédiaire d'un second filtre ayant une bande de transmission correspondant à la seconde longueur d'onde, et mesure le jeu sur la base d'une différence de temps de la synchronisation de détection du corps rotatif.
(JA) クリアランス計測装置は、ケーシングの内周面と回転体の外周面との間のクリアランスを計測するための装置である。この装置は、回転体の外周面に向けて第1波長及び第2波長を有する光をそれぞれ出射し、外周面からの反射光を、第1波長に対応する透過帯域を有する第1フィルタを介して受光するとともに、第2波長に対応する透過帯域を有する第2フィルタを介して受光し、回転体の検出タイミングの時間差に基づいてクリアランスを計測する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)