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1. (WO2018198210) ABNORMAL DEVICE DISCRIMINATION DEVICE, METHOD, AND PROGRAM
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Pub. No.: WO/2018/198210 International Application No.: PCT/JP2017/016446
Publication Date: 01.11.2018 International Filing Date: 25.04.2017
IPC:
H02J 13/00 (2006.01)
H ELECTRICITY
02
GENERATION, CONVERSION, OR DISTRIBUTION OF ELECTRIC POWER
J
CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
13
Circuit arrangements for providing remote indication of network conditions, e.g. an instantaneous record of the open or closed condition of each circuitbreaker in the network; Circuit arrangements for providing remote control of switching means in a power distribution network, e.g. switching in and out of current consumers by using a pulse code signal carried by the network
Applicants:
日本電気株式会社 NEC CORPORATION [JP/JP]; 東京都港区芝五丁目7番1号 7-1, Shiba 5-chome, Minato-ku, Tokyo 1088001, JP
Inventors:
河本 滋 KOUMOTO, Shigeru; JP
鈴木 亮太 SUZUKI, Ryota; JP
ペトラードワラー ムルトゥザ PETLADWALA, Murtuza; JP
Agent:
加藤 朝道 KATO, Asamichi; JP
Priority Data:
Title (EN) ABNORMAL DEVICE DISCRIMINATION DEVICE, METHOD, AND PROGRAM
(FR) DISPOSITIF, PROCÉDÉ ET PROGRAMME DE DÉTERMINATION DE DISPOSITIF PRÉSENTANT UNE ANOMALIE
(JA) 異常機器判別装置、方法、プログラム
Abstract:
(EN) The present invention makes it possible to discriminate in which device an abnormality has occurred when the abnormality is detected in the combined waveform of a plurality of devices. An abnormal device discrimination device is provided with: a means for detecting an abnormal waveform from the combined waveform of a plurality of devices; a means for removing the abnormal waveform from the combined waveform; a means for separating the combined waveform from which the abnormal waveform is removed into the waveform of each device and identifying the state of said each device; a means for calculating the degree of coincidence between time during which said each device is in the on-state and time when the abnormal waveform has occurred; and a means for discriminating, on the basis of the degree of coincidence, a device in which an abnormality has occurred.
(FR) La présente invention permet de déterminer dans quel dispositif une anomalie s'est produite quand l'anomalie est détectée dans la forme d'onde combinée d'une pluralité de dispositifs. Un dispositif de détermination de dispositif présentant une anomalie comprend : un moyen permettant de détecter une forme d'onde anormale à partir de la forme d'onde combinée d'une pluralité de dispositifs ; un moyen permettant d'éliminer la forme d'onde anormale de la forme d'onde combinée ; un moyen permettant de séparer la forme d'onde combinée de laquelle la forme d'onde anormale est éliminée dans la forme d'onde de chaque dispositif et d'identifier l'état dudit dispositif ; un moyen permettant de calculer le degré de coïncidence entre le temps pendant lequel ledit dispositif est dans l'état de marche et le moment où la forme d'onde anormale est apparue ; et un moyen permettant de déterminer, en fonction du degré de coïncidence, un dispositif dans lequel une anomalie s'est produite.
(JA) 複数の機器の合成波形に異常が検知された場合に、どの機器に異常が発生したかを判別可能とする。複数の機器の合成波形から異常波形を検出する手段と、前記合成波形から前記異常波形を除去する手段と、前記異常波形を除去した合成波形を機器毎の波形に分離し前記機器の状態を識別する手段と、前記各機器毎のオン状態の時刻と前記異常波形の発生時刻との一致度を算出する手段と、前記一致度に基づき、異常が発生した機器を判別する手段とを備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)