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1. (WO2018197598) PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES

Pub. No.:    WO/2018/197598    International Application No.:    PCT/EP2018/060672
Publication Date: Fri Nov 02 00:59:59 CET 2018 International Filing Date: Fri Apr 27 01:59:59 CEST 2018
IPC: G01R 1/073
Applicants: TECHNOPROBE S.P.A.
Inventors: LIBERINI, Riccardo
Title: PROBE CARD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES
Abstract:
It is described a probe card for a testing apparatus of electronic devices comprising at least one probe head (21) housing a plurality of contact probes (22), each contact probe (22) having at least one contact tip adapted to abut onto contact pads of a device under test (23), as well as a main support (27) and an intermediate support (24) connected to the main support (27) and adapted to realize a spatial transformation of distances between contact pads on its opposite faces as a space transformer (24). Suitably, the probe card (20) comprises at least one connecting element (30) adapted to link the space transformer (24) and the main support (27), this connecting element (30) having a substantially rod-like body (30C) and being equipped with a first end portion (30A) comprising at least one terminal section (30A1) adapted to be engaged in a corresponding housing realized in the space transformer (24) and with a secondterminal portion (30B) adapted to abut onto an abutment element (28) linked to the main support (27).