Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018193699) SEMICONDUCTOR STORAGE CIRCUIT, SEMICONDUCTOR STORAGE APPARATUS, AND DATA DETECTION METHOD
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2018/193699 International Application No.: PCT/JP2018/005541
Publication Date: 25.10.2018 International Filing Date: 16.02.2018
IPC:
G11C 11/419 (2006.01) ,G11C 7/12 (2006.01) ,G11C 7/18 (2006.01)
G PHYSICS
11
INFORMATION STORAGE
C
STATIC STORES
11
Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
21
using electric elements
34
using semiconductor devices
40
using transistors
41
forming cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
413
Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
417
for memory cells of the field-effect type
419
Read-write (R-W) circuits
G PHYSICS
11
INFORMATION STORAGE
C
STATIC STORES
7
Arrangements for writing information into, or reading information out from, a digital store
12
Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
G PHYSICS
11
INFORMATION STORAGE
C
STATIC STORES
7
Arrangements for writing information into, or reading information out from, a digital store
18
Bit line organisation; Bit line lay-out
Applicants:
株式会社ソシオネクスト SOCIONEXT INC. [JP/JP]; 神奈川県横浜市港北区新横浜二丁目10番23 2-10-23 Shin-Yokohama, Kohoku-Ku, Yokohama-shi, Kanagawa 2220033, JP
Inventors:
山上 由展 YAMAGAMI Yoshinobu; --
Agent:
特許業務法人前田特許事務所 MAEDA & PARTNERS; 大阪府大阪市北区堂島浜1丁目2番1号 新ダイビル23階 Shin-Daibiru Bldg. 23F, 2-1, Dojimahama 1-chome, Kita-ku, Osaka-shi, Osaka 5300004, JP
Priority Data:
2017-08364820.04.2017JP
Title (EN) SEMICONDUCTOR STORAGE CIRCUIT, SEMICONDUCTOR STORAGE APPARATUS, AND DATA DETECTION METHOD
(FR) CIRCUIT DE STOCKAGE À SEMI-CONDUCTEURS, APPAREIL DE STOCKAGE À SEMI-CONDUCTEURS ET PROCÉDÉ DE DÉTECTION DE DONNÉES
(JA) 半導体記憶回路、半導体記憶装置及びデータ検出方法
Abstract:
(EN) A conductor storage circuit (A) has: a first precharging transistor (P11) and a plurality of first memory cells (MC) that are connected to a first local read-bit line; and a second precharging transistor (P12) and a plurality of second memory cells (MC) that are connected to a second local read-bit line. A signal generated in response to a signal outputted to the first and second local read-bit lines is outputted to a global read-bit line through a gate circuit and an output circuit. First transistors (P31, P32) having respective gates connected to the output of the gate circuit are provided between the first and second local read-bit lines.
(FR) L"invention concerne un circuit de stockage de conducteur (A) qui comprend : un premier transistor de préchargement (P11) et une pluralité de premières cellules de mémoire (MC) qui sont reliées à une première ligne de lecture bits locale ; et un second transistor de préchargement (P12) et une pluralité de secondes cellules de mémoire (MC) qui sont reliées à une seconde ligne de lecture bits locale. Un signal généré en réponse à un signal émis vers les première et seconde lignes de lecture bits locales est délivré en sortie à une ligne de lecture bits globale par l'intermédiaire d'un circuit de grille et d'un circuit de sortie. Des premiers transistors (P31, P32) comportant des grilles respectives reliées à la sortie du circuit de grille sont disposés entre les première et seconde lignes de lecture bits locales.
(JA) 導体記憶回路(A)は、第1のローカルリードビット線に接続された複数の第1のメモリセル(MC)および第1のプリチャージトランジスタ(P11)と、第2のローカルリードビット線に接続された複数の第2のメモリセル(MC)および第2のプリチャージトランジスタ(P12)とを有する。そして、第1のおよび第2のローカルリードビット線に出力される信号に応じた信号がゲート回路および出力回路を経由してグローバルリードビット線に出力される。第1および第2のローカルリードビット線の間には、ゲートがゲート回路の出力に接続された第1のトランジスタ(P31,P32)が設けられている。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)