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1. (WO2018193572) SPECTROPHOTOMETER
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2018/193572 International Application No.: PCT/JP2017/015859
Publication Date: 25.10.2018 International Filing Date: 20.04.2017
IPC:
G01J 3/36 (2006.01) ,G01N 21/17 (2006.01) ,G01N 21/27 (2006.01)
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28
Investigating the spectrum
30
Measuring the intensity of spectral lines directly on the spectrum itself
36
Investigating two or more bands of a spectrum by separate detectors
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27
using photo-electric detection
Applicants:
株式会社島津製作所 SHIMADZU CORPORATION [JP/JP]; 京都府京都市中京区西ノ京桑原町1番地 1, Nishinokyo-kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto 6048511, JP
Inventors:
渡邉 真人 WATANABE Masato; JP
軍司 昌秀 GUNJI Masahide; JP
Agent:
野口 大輔 NOGUCHI Daisuke; JP
Priority Data:
Title (EN) SPECTROPHOTOMETER
(FR) SPECTROPHOTOMÈTRE
(JA) 分光光度計
Abstract:
(EN) In this spectrophotometer, the positional relation between a spectroscope and a PDA is set such that the distance between a reflection position of light reflected onto a light-receiving surface of a PD, among PDs constituting the PDA, that receives light at least having a wavelength between 200 nm and 300 nm and an incident position at which the reflected light enters a light-receiving surface of said PDA after being reflected once again on a protective plate becomes equal to or less than the width dimension of one of the PDs constituting the PDA.
(FR) L'invention concerne un spectrophotomètre dans lequel la relation de position entre un spectroscope et un PDA est réglée de telle sorte que la distance entre une position de réflexion de la lumière réfléchie sur une surface de réception de lumière d'une PD, parmi des PD constituant le PDA, qui reçoit de la lumière présentant au moins une longueur d'onde comprise entre 200 nm et 300 nm et une position incidente au niveau de laquelle la lumière réfléchie entre dans une surface de réception de lumière dudit PDA après avoir été réfléchie une nouvelle fois sur une plaque de protection devienne inférieure ou égale à la dimension de largeur de l'une des PD constituant le PDA.
(JA) 分光光度計は、PDAを構成するPDのうち、少なくとも200nmから300nmまでの間の波長をもつ光を受光するPDの受光面で反射した光の反射位置と、その反射光が保護板で再び反射して当該PDAの受光面へ入射するときのその入射位置との間の距離が、当該PDAを構成する1つのPDの幅寸法以下となるように、分光器とPDAとの位置関係が設定されている。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)