WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Options
Query Language
Stem
Sort by:
List Length
Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018185893) UNMEASURED AREA EXTRACTION DEVICE, WORK GUIDANCE DEVICE, AND WORK GUIDANCE METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/185893 International Application No.: PCT/JP2017/014280
Publication Date: 11.10.2018 International Filing Date: 05.04.2017
IPC:
G01B 21/20 (2006.01) ,B05C 11/00 (2006.01) ,G01B 21/08 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
20
for measuring contours or curvatures, e.g. determining profile
B PERFORMING OPERATIONS; TRANSPORTING
05
SPRAYING OR ATOMISING IN GENERAL; APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
C
APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
11
Component parts, details or accessories not specifically provided for in groups B05C1/-B05C9/132
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
02
for measuring length, width, or thickness
08
for measuring thickness
Applicants: NIKON CORPORATION[JP/JP]; 15-3, Konan 2-chome, Minato-ku, Tokyo 1086290, JP
Inventors: MATSUHIRA, Masaya; JP
Agent: NAGAI, Fuyuki; JP
WATANABE, Takao; JP
Priority Data:
Title (EN) UNMEASURED AREA EXTRACTION DEVICE, WORK GUIDANCE DEVICE, AND WORK GUIDANCE METHOD
(FR) DISPOSITIF D'EXTRACTION DE ZONE NON MESURÉE, DISPOSITIF DE GUIDAGE DE TRAVAIL ET PROCÉDÉ DE GUIDAGE DE TRAVAIL
(JA) 未測定領域抽出装置、作業ガイダンス装置、および作業ガイダンス方法
Abstract:
(EN) This unmeasured area extraction device is provided with a position measurement unit for measuring position information for each part of an object under measurement, an image acquisition unit for acquiring image information for the parts under measurement of the object under measurement that have been measured by the position measurement unit, an overall image generation unit for generating overall image information for the object under measurement from the image information for each part under measurement, and an unmeasured part extraction unit for extracting a part where position information for the object under measurement is unmeasured on the basis of the overall image information.
(FR) L'invention concerne un dispositif d'extraction de zone non mesurée pourvu d'une unité de mesure de position pour mesurer des informations de position pour chaque partie d'un objet à mesurer, d'une unité d'acquisition d'image pour acquérir des informations d'image pour les parties en cours de mesure de l'objet à mesurer qui ont été mesurées par l'unité de mesure de position, d'une unité de génération d'image globale pour générer des informations d'image globale pour l'objet en cours de mesure à partir des informations d'image pour chaque partie en cours de mesure, et d'une unité d'extraction de partie non mesurée pour extraire une partie où des informations de position pour l'objet à mesurer ne sont pas mesurées sur la base des informations d'image globale.
(JA) 未測定領域抽出装置は、被測定物の部分ごとの位置情報を測定する位置測定部と、前記位置測定部により測定された前記被測定物の被測定部分の画像情報を取得する画像取得部と、前記被測定部分ごとの画像情報から、前記被測定物の全体画像情報を生成する全体画像生成部と、前記全体画像情報に基づき、前記被測定物における前記位置情報が未測定の部分を抽出する未測定部分抽出部と、を備える。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)