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1. (WO2018185891) COATING FILM STATE ANALYSIS DEVICE AND FILM THICKNESS MEASUREMENT DEVICE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/185891 International Application No.: PCT/JP2017/014278
Publication Date: 11.10.2018 International Filing Date: 05.04.2017
IPC:
G01B 21/08 (2006.01) ,B05C 11/00 (2006.01) ,G01B 11/02 (2006.01) ,G01N 21/27 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
02
for measuring length, width, or thickness
08
for measuring thickness
B PERFORMING OPERATIONS; TRANSPORTING
05
SPRAYING OR ATOMISING IN GENERAL; APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
C
APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
11
Component parts, details or accessories not specifically provided for in groups B05C1/-B05C9/132
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
02
for measuring length, width, or thickness
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27
using photo-electric detection
Applicants: NIKON CORPORATION[JP/JP]; 15-3, Konan 2-chome, Minato-ku, Tokyo 1086290, JP
Inventors: KAYABA, Hiroyuki; JP
Agent: NAGAI, Fuyuki; JP
WATANABE, Takao; JP
Priority Data:
Title (EN) COATING FILM STATE ANALYSIS DEVICE AND FILM THICKNESS MEASUREMENT DEVICE
(FR) DISPOSITIF D'ANALYSE D'ÉTAT DE FILM DE REVÊTEMENT ET DISPOSITIF DE MESURE D'ÉPAISSEUR DE FILM
(JA) 塗膜状態解析装置および膜厚測定装置
Abstract:
(EN) A coating film state analysis device comprising an acquisition unit for acquiring surface data pertaining to a to-be-coated region, a sorting unit for sorting from the surface data acquired by the acquisition unit into post-coating-operation surface data and pre-coating-operation surface data, and an analysis unit for analyzing the state of a coating film formed in the to-be-coated region on the basis of the post-coating-operation surface data and the pre-coating-operation surface data sorted by the sorting unit.
(FR) Dispositif d'analyse d'état de film de revêtement comprenant une unité d'acquisition pour acquérir des données de surface concernant une région à revêtir, une unité de tri pour trier à partir des données de surface acquises par l'unité d'acquisition en des données de surface de post-revêtement et des données de surface de pré-revêtement, et une unité d'analyse pour analyser l'état d'un film de revêtement formé dans la région à revêtir sur la base des données de surface de post-revêtement et des données de surface de pré-revêtement triées par l'unité de tri.
(JA) 塗膜状態解析装置は、塗装対象領域の表面データを取得する取得部と、前記取得部により取得された前記表面データから塗装作業済みの表面データと塗装作業前の表面データとに分類する分類部と、前記分類部により分類された前記塗装作業済みの表面データと前記塗装作業前の表面データとに基づいて、前記塗装対象領域に形成された塗膜の状態を解析する解析部と、を備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)