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1. (WO2018185599) METHOD FOR ANALYZING ORGANIC SEMICONDUCTOR ELEMENTS
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Pub. No.: WO/2018/185599 International Application No.: PCT/IB2018/052022
Publication Date: 11.10.2018 International Filing Date: 26.03.2018
IPC:
G01N 27/62 (2006.01) ,C09K 11/06 (2006.01) ,G01N 21/27 (2006.01) ,G01N 21/64 (2006.01) ,G01N 23/2255 (2018.01) ,G01N 24/08 (2006.01) ,G01N 30/06 (2006.01) ,G01N 30/72 (2006.01) ,G01N 30/88 (2006.01) ,H01L 51/50 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
62
by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
C CHEMISTRY; METALLURGY
09
DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
K
MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
11
Luminescent, e.g. electroluminescent, chemiluminescent, materials
06
containing organic luminescent materials
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27
using photo-electric detection
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
[IPC code unknown for G01N 23/2255]
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
24
Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
08
by using nuclear magnetic resonance
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
30
Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
02
Column chromatography
04
Preparation or injection of sample to be analysed
06
Preparation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
30
Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
02
Column chromatography
62
Detectors specially adapted therefor
72
Mass spectrometers
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
30
Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
02
Column chromatography
88
Integrated analysis systems specially adapted therefor, not covered by a single one of groups G01N30/04-G01N30/86146
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
51
Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof
50
specially adapted for light emission, e.g. organic light emitting diodes (OLED) or polymer light emitting devices (PLED)
Applicants: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.[JP/JP]; 398, Hase, Atsugi-shi, Kanagawa 2430036, JP
Inventors: KAWAKAMI, Sachiko; JP
KOMATSU, Nozomi; JP
SEO, Satoshi; JP
Priority Data:
2017-07469004.04.2017JP
Title (EN) METHOD FOR ANALYZING ORGANIC SEMICONDUCTOR ELEMENTS
(FR) PROCÉDÉ D'ANALYSE D'ÉLÉMENTS À SEMI-CONDUCTEUR ORGANIQUE
(JA) 有機半導体素子の分析方法
Abstract:
(EN) Provided is a method for analyzing light-emitting elements. This method is for analyzing organic semiconductor elements which comprise, between a pair of electrodes, an organic semiconductor layer including one or a plurality of layers. Each organic semiconductor element is analyzed by using the following steps: a step (S2) in which one electrode of the organic semiconductor element is peeled away; a step (S3) in which the laminate and/or the mixture state of the exposed organic semiconductor layer is analyzed using a first mass spectrometry method; a step (S4) in which at least one or a plurality of the organic compounds in each layer of the organic semiconductor layer is eluted by using a solvent to prepare a solution; a step (S5) in which the organic compounds contained in the solution are isolated by using liquid chromatography; a step (S6) in which the mass to charge ratio of the isolated organic compounds is detected by using a second mass spectrometry method; a step (S8) in which the mass to charge ratio (D1) detected by the first mass spectrometry method and the mass to charge ratio (D2) detected by the second mass spectrometry method are contrasted with each other; and a step in which the physical properties of the isolated organic compounds are measured.
(FR) L'invention concerne un procédé d'analyse d'éléments électroluminescents. Ce procédé est destiné à analyser des éléments à semi-conducteur organique qui comprennent, entre une paire d'électrodes, une couche semi-conductrice organique comportant une ou plusieurs couches. Chaque élément à semi-conducteur organique est analysé à l'aide des étapes suivantes : une étape (S2) dans laquelle une électrode de l'élément à semi-conducteur organique est décollée; une étape (S3) dans laquelle le stratifié et/ou l'état de mélange de la couche semi-conductrice organique exposée sont analysés à l'aide d'un premier procédé de spectrométrie de masse; une étape (S4) dans laquelle au moins un des composés organiques dans chaque couche de la couche semi-conductrice organique est élué à l'aide d'un solvant pour la préparation d'une solution; une étape (S5) dans laquelle les composés organiques contenus dans la solution sont isolés à l'aide d'une chromatographie en phase liquide; une étape (S6) dans laquelle le rapport masse/charge des composés organiques isolés est détecté à l'aide d'un second procédé de spectrométrie de masse; une étape (S8) dans lequel le rapport masse/charge (D1) détecté par le premier procédé de spectrométrie de masse et le rapport masse/charge (D2) détecté par le second procédé de spectrométrie de masse sont comparés l'un avec l'autre; et une étape dans laquelle les propriétés physiques des composés organiques isolés sont mesurées.
(JA) 発光素子の分析方法を提供する。 一対の電極間に一つまたは複数の層を含む有機半導体層を有する有機半導体素子の分析方法である。 有機半導体素子の一方の電極を剥離する工程(S2)と、露出した有機半導体層の積層およびZまたは混合状態を第1の質量分析法により分析する工程(S3)と、有機半導体層の各層に含まれる有機化合物の少なくともいずれか一または複数を溶剤により溶出させ、溶液を作製する工程(S4)と、液体クロマトグラフィーを用いて、溶液に含まれる有機化合物を単離し(S5)、単離した有機化合物の質量電荷比を第2の質量分析法により検出する工程(S6)と、第1の質量分析法により検出した質量電荷比(D1)と、第2の質量分析により検出した質量電荷比(D2)とを対比する工程(S8)と、単離した有機化合物の物性を測定する工程を用いて、有機半導体素子を分析する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)