Search International and National Patent Collections

1. (WO2018181798) KIT, METHOD AND REAGENT FOR MEASURING MEASUREMENT TARGET SUBSTANCE

Pub. No.:    WO/2018/181798    International Application No.:    PCT/JP2018/013408
Publication Date: Fri Oct 05 01:59:59 CEST 2018 International Filing Date: Fri Mar 30 01:59:59 CEST 2018
IPC: G01N 33/543
C07F 5/02
G01N 21/64
G01N 21/78
G01N 37/00
Applicants: FUJIFILM CORPORATION
富士フイルム株式会社
Inventors: CHIKU Hiroyuki
知久 浩之
WATANABE Kousuke
渡辺 康介
KANEKO Kazuhei
金子 和平
HAMADA Kazuhiro
▲浜▼田 和博
SASAKI Kouitsu
佐々木 晃逸
YOSHIOKA Tomoaki
吉岡 知昭
HANAKI Naoyuki
花木 直幸
Title: KIT, METHOD AND REAGENT FOR MEASURING MEASUREMENT TARGET SUBSTANCE
Abstract:
The present invention addresses the problem of providing a kit, method and reagent capable of accurately measuring a measurement target substance across a broad concentration range extending from low to high concentrations, suppressing an increase in produced noise, and preventing against the problem of false positives caused by nonspecific adsorption. The present invention provides a kit which measures a measurement target substance and includes first particles which have a marker and are modified with a first binding substance which specifically binds to the measurement target substance, second particles which do not have a marker and are modified with a second binding substance which does not specifically bind to the measurement target substance, a channel through which the first and second particles flow, and a substrate which has either a third binding substance which specifically binds to the measurement target substance or a substance which binds to the first binding substance, wherein the first particles having the marker are light-emitting marker particles containing particles and at least one type of compound represented by formula (1). The symbols in formula (1) are as described in the description of the present application.