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1. (WO2018181499) PHOTOELECTRIC CONVERSION ELEMENT AND PHOTOELECTRIC CONVERSION ELEMENT MANUFACTURING METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/181499 International Application No.: PCT/JP2018/012813
Publication Date: 04.10.2018 International Filing Date: 28.03.2018
IPC:
H01L 31/0224 (2006.01) ,H01L 21/288 (2006.01) ,H01L 31/0747 (2012.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
31
Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
02
Details
0224
Electrodes
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
21
Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
02
Manufacture or treatment of semiconductor devices or of parts thereof
04
the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
18
the devices having semiconductor bodies comprising elements of the fourth group of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
28
Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20-H01L21/268158
283
Deposition of conductive or insulating materials for electrodes
288
from a liquid, e.g. electrolytic deposition
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
31
Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
04
adapted as conversion devices
06
characterised by at least one potential-jump barrier or surface barrier
072
the potential barriers being only of the PN heterojunction type
0745
comprising a AIVBIV heterojunction, e.g. Si/Ge, SiGe/Si or Si/SiC solar cells
0747
comprising a heterojunction of crystalline and amorphous materials, e.g. heterojunction with intrinsic thin layer or HIT solar cells
Applicants: KANEKA CORPORATION[JP/JP]; 2-3-18, Nakanoshima, Kita-ku, Osaka-shi, Osaka 5308288, JP
Inventors: FUKUDA, Masanori; JP
Agent: HARUKA PATENT & TRADEMARK ATTORNEYS; Rokubancho SK Bldg. 5th Floor, 3, Rokubancho, Chiyoda-ku, Tokyo 1020085, JP
Priority Data:
2017-07232831.03.2017JP
Title (EN) PHOTOELECTRIC CONVERSION ELEMENT AND PHOTOELECTRIC CONVERSION ELEMENT MANUFACTURING METHOD
(FR) ÉLÉMENT DE CONVERSION PHOTOÉLECTRIQUE ET SON PROCÉDÉ DE FABRICATION
(JA) 光電変換素子及び光電変換素子の製造方法
Abstract:
(EN) A photoelectric conversion element manufacturing method of the present disclosure comprises: a step of preparing a semiconductor substrate having an n-type semiconductor portion and a p-type semiconductor portion which configures a diode with the n-type semiconductor portion; a step of forming an n-side base conductive layer in at least a part of the n-type semiconductor portion; a step of forming a p-side base conductive layer in at least a part of the p-type semiconductor portion; and a step of forming a plated layer in at least a part of the n-side base conductive layer and at least a part of the p-side base conductive layer by immersing the n-side base conductive layer and the p-side base conductive layer in a plating solution, and, with the n-side base conductive layer and the p-side base conductive layer being electrically connected only by means of the diode, feeding power to the n-side base conductive layer.
(FR) Un procédé de fabrication d'élément de conversion photoélectrique de la présente invention comprend : une étape de préparation d'un substrat semiconducteur ayant une portion semiconductrice de type n et une portion semiconductrice de type p qui configure une diode avec la portion semiconductrice de type n; une étape de formation d'une couche conductrice de base côté n dans au moins une partie de la portion semiconductrice de type n; une étape de formation d'une couche conductrice de base côté p dans au moins une partie de la portion semiconductrice de type p; et une étape de formation d'une couche plaquée dans au moins une partie de la couche conductrice de base côté n et au moins une partie de la couche conductrice de base côté p par immersion de la couche conductrice de base côté n et de la couche conductrice de base côté p dans une solution de placage, et, la couche conductrice de base côté n et la couche conductrice de base côté p étant électroconnectées uniquement au moyen de la diode, fournissant de l'énergie à la couche conductrice de base côté n.
(JA) 本開示の光電変換素子の製造方法は、n型半導体部と、前記n型半導体部と共にダイオードを構成するp型半導体部と、を有する半導体基板を準備する工程と、前記n型半導体部の少なくとも一部にn側下地導電層を形成する工程と、前記p型半導体部の少なくとも一部にp側下地導電層を形成する工程と、前記n側下地導電層と前記p側下地導電層とをめっき液に浸漬し、前記n側下地導電層と前記p側下地導電層とが、前記ダイオードのみによって電気的に接続された状態で、前記n側下地導電層を給電することにより、前記n側下地導電層の少なくとも一部と、前記p側下地導電層の少なくとも一部と、にめっき層を形成する工程と、を含む。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)