Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018179950) SENSOR CHIP FOR SAMPLE DETECTION SYSTEM
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/179950 International Application No.: PCT/JP2018/005167
Publication Date: 04.10.2018 International Filing Date: 15.02.2018
IPC:
G01N 21/15 (2006.01) ,G01N 21/05 (2006.01) ,G01N 21/64 (2006.01) ,G01N 21/41 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
15
Preventing contamination of the components of the optical system or obstruction of the light path
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
03
Cuvette constructions
05
Flow-through cuvettes
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
41
Refractivity; Phase-affecting properties, e.g. optical path length
Applicants:
コニカミノルタ株式会社 KONICA MINOLTA, INC. [JP/JP]; 東京都千代田区丸の内二丁目7番2号 2-7-2, Marunouchi, Chiyoda-ku, Tokyo 1007015, JP
Inventors:
三宅 祐輝 MIYAKE Yuki; JP
青木 洋一 AOKI Youichi; JP
野田 哲也 NODA Tetsuya; JP
Agent:
特許業務法人SSINPAT SSINPAT PATENT FIRM; 東京都品川区西五反田七丁目13番6号 五反田山崎ビル6階 Gotanda Yamazaki Bldg. 6F, 13-6, Nishigotanda 7-chome, Shinagawa-ku, Tokyo 1410031, JP
Priority Data:
2017-06788630.03.2017JP
Title (EN) SENSOR CHIP FOR SAMPLE DETECTION SYSTEM
(FR) PUCE DE CAPTEUR POUR SYSTÈME DE DÉTECTION D'ÉCHANTILLON
(JA) 検体検出システム用センサーチップ
Abstract:
(EN) [Problem] To provide a sensor chip that is for a sample detection system and is capable of suppressing the occurrence of bubbles in a flow path and preventing measurement accuracy degradation. [Solution] The flow path is made to have a slope such that the height of the flow path in the vicinity of a reaction site is higher than the height of the flow path in the vicinity of a first through-hole.
(FR) Le problème décrit par la présente invention est de fournir une puce de capteur pour système de détection d'échantillon qui est capable de supprimer l'apparition de bulles dans un trajet d'écoulement et d'empêcher une dégradation de la précision de mesure. A cet effet, le trajet d'écoulement est conçu pour présenter une pente telle à ce que la hauteur du trajet d'écoulement à proximité d'un site de réaction soit supérieure à la hauteur du trajet d'écoulement au voisinage d'un premier trou traversant.
(JA) [課題]流路内に気泡が発生することを抑制し、測定精度の低下を防止することができる検体検出システム用センサーチップを提供する。 [解決手段]流路の反応場近傍における高さが、流路の第1貫通孔近傍における高さよりも高くなるように、流路に勾配を設ける。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)