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1. (WO2018179744) X-RAY ANALYSIS ASSISTANCE DEVICE AND X-RAY ANALYSIS DEVICE

Pub. No.:    WO/2018/179744    International Application No.:    PCT/JP2018/002205
Publication Date: Fri Oct 05 01:59:59 CEST 2018 International Filing Date: Fri Jan 26 00:59:59 CET 2018
IPC: G01N 23/201
G01N 23/205
Applicants: RIGAKU CORPORATION
株式会社リガク
Inventors: TANIGUCHI Yayoi
谷口 やよい
MORIKAWA Keiichi
森川 惠一
Title: X-RAY ANALYSIS ASSISTANCE DEVICE AND X-RAY ANALYSIS DEVICE
Abstract:
An X-ray analysis assistance device according to the present invention is provided with an input and operation device 24 for arbitrarily inputting and setting the value of one from among the distance L between a sample S and a two-dimensional detector 2 and the maximum detection range Xmax for X-rays scattered or diffracted by the sample S, and a central processing unit 20 for automatically setting the other setting item on the basis of the value of the one setting item set by the input and operation device 24. Further, the maximum measurement frame Hmax for the X-rays is displayed on a display screen 22 of a display device 21 on the basis of the distance L and maximum detection range Xmax. Additionally, an X-ray detection area A indicating the range within which it is possible for the detection surface of the two-dimensional detector 2 to detect X-rays is displayed on the display screen 22 of the display device 21.