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1. (WO2018166444) PHOTOETCHING APPARATUS AND METHOD
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Pub. No.: WO/2018/166444 International Application No.: PCT/CN2018/078829
Publication Date: 20.09.2018 International Filing Date: 13.03.2018
IPC:
G03F 7/20 (2006.01) ,G03F 9/00 (2006.01)
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
F
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
7
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
20
Exposure; Apparatus therefor
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
F
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
9
Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
Applicants:
上海微电子装备(集团)股份有限公司 SHANGHAI MICRO ELECTRONICS EQUIPMENT(GROUP) CO., LTD. [CN/CN]; 中国上海市 张江高科技园区张东路1525号 1525 Zhangdong Road, Zhangjiang High-Tech Park Shanghai 201203, CN
Inventors:
周畅 ZHOU, Chang; CN
杨志勇 YANG, Zhiyong; CN
马琳琳 MA, Linlin; CN
Agent:
上海思微知识产权代理事务所(普通合伙) SHANGHAI SAVVY INTELLECTUAL PROPERTY AGENCY; 中国上海市 长宁区天山西路789号1幢341室 Room 341, Building 1 789 West Tianshan Road, Changning District Shanghai 200335, CN
Priority Data:
201710154356.415.03.2017CN
Title (EN) PHOTOETCHING APPARATUS AND METHOD
(FR) APPAREIL ET PROCÉDÉ DE PHOTOGRAVURE
(ZH) 光刻装置及方法
Abstract:
(EN) Disclosed are a photoetching apparatus and method. The photoetching apparatus comprises at least two sets of exposure apparatus and one set of substrate apparatus, wherein the substrate apparatus comprises a substrate table (10) and a substrate (7), wherein the substrate table (10) carries the substrate (7); and the at least two sets of exposure apparatus are symmetrically distributed, in the direction of exposure scanning, above the substrate (7), and form two exposure fields on the substrate (7) to expose the substrate (7) in the exposure fields.
(FR) L'invention concerne un appareil et un procédé de photogravure. L'appareil de photogravure comprend au moins deux ensembles d'appareil d'exposition et un ensemble d'appareil de substrat, l'appareil de substrat comprenant une table de substrat (10) et un substrat (7), la table de substrat (10) portant le substrat (7) ; et lesdits ensembles d'appareil d'exposition sont répartis symétriquement, dans la direction de balayage d'exposition, au-dessus du substrat (7), et forment deux champs d'exposition sur le substrat (7) pour exposer le substrat (7) dans les champs d'exposition.
(ZH) 一种光刻装置及方法,光刻装置包括至少两套曝光装置和一套基板装置,其中:基板装置包括一基板台(10)和一基板(7),基板台(10)承载基板(7);至少两套曝光装置沿曝光扫描方向对称分布在基板(7)上方,同时在基板(7)上形成两个曝光场,对曝光场内基板(7)进行曝光。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Chinese (ZH)
Filing Language: Chinese (ZH)