WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Options
Query Language
Stem
Sort by:
List Length
1. (WO2018165591) METHOD AND APPARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROSCOPY BASED ON PHOTOTHERMAL EFFECT
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/165591 International Application No.: PCT/US2018/021814
Publication Date: 13.09.2018 International Filing Date: 09.03.2018
IPC:
G01Q 60/00 (2010.01) ,G01Q 60/18 (2010.01) ,G01Q 60/24 (2010.01) ,G01Q 60/38 (2010.01) ,G01N 21/35 (2014.01) ,G01N 21/65 (2006.01) ,G01J 3/44 (2006.01)
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
18
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
24
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
24
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38
Probes, their manufacture or their related instrumentation, e.g. holders
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31
Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35
using infra-red light
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
65
Raman scattering
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28
Investigating the spectrum
44
Raman spectrometry; Scattering spectrometry
Applicants: PHOTOTHERMAL SPECTROSCOPY CORP.[US/US]; 325 Chapala Street Santa Barbara, CA 93101, US
Inventors: YANG, Honghua; US
PRATER, Craig; US
Agent: PEDERSEN, Brad; US
BIASCO, Tye; US
CHADWICK, Eric, H.; US
BRUZZONE, Daniel, L.; US
BURGESS, Daidre, L.; US
Priority Data:
62/469,34909.03.2017US
Title (EN) METHOD AND APPARATUS FOR INFRARED SCANNING NEAR-FIELD OPTICAL MICROSCOPY BASED ON PHOTOTHERMAL EFFECT
(FR) PROCÉDÉ ET APPAREIL DE MICROSCOPIE OPTIQUE EN CHAMP PROCHE À BALAYAGE À INFRAROUGES SUR LA BASE DE L’EFFET PHOTOTHERMIQUE
Abstract:
(EN) Systems and methods may be provided for measuring an infrared absorption of a sub micrometer region of a sample. An Infrared light source may illuminate a sample in a region that is interacting with the tip of a Scanning Probe Microscope (SPM), stimulating the sample in a way that produces measurable optical properties related to Infrared absorption of the sample region. A probe light source is directed at the region of the sample and SPM tip, and probe light emanating from the tip and sample region is collected. The collected light may be used to derive infrared absorption spectrum information of the sample region, possibly on a sub-micron scale.
(FR) L’invention peut concerner des systèmes et des procédés pour la mesure d’une absorption d’infrarouges d’une zone d’un échantillon inférieure au micromètre. Une source de lumière à infrarouges peut éclairer un échantillon dans une zone qui interagit avec la pointe d’un microscope à sonde de balayage (SPM), stimulant l’échantillon d’une manière qui produit des propriétés optiques mesurables associées à l’absorption d’infrarouges de la zone d’échantillon. Une source de lumière de sonde est dirigée vers la zone de l’échantillon et la pointe du SPM, et la lumière de sonde émanant de la pointe et de la zone d’échantillon est collectée. La lumière collectée peut servir à déduire des informations de spectre d’absorption d’infrarouges de la zone d’échantillon, potentiellement à une échelle inférieure au micromètre.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)