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1. (WO2018165534) TEST SYSTEM AND METHOD

Pub. No.:    WO/2018/165534    International Application No.:    PCT/US2018/021716
Publication Date: Fri Sep 14 01:59:59 CEST 2018 International Filing Date: Sat Mar 10 00:59:59 CET 2018
IPC: G01R 31/319
G01R 31/28
Applicants: ADVANTEST CORPORATION
SU, Mei-Mei
Inventors: SU, Mei-Mei
Title: TEST SYSTEM AND METHOD
Abstract:
Presented embodiments facilitate efficient and effective access to a device under test. In one embodiment, a test system comprises: a primitive configured to control testing of a device under test (DUT) and a device interface board (DIB). The device interface board comprises: a loadboard, an environmental control component and a device under test access interface. The loadboard is configured to selectively couple with a device under test and a primitive. The environmental control component is configured to control environmental conditions. The device under test access interface is configured to allow robotic manipulation of the device under test. The manipulation can include selectively coupling the device under test to the loadboard. The device under test access interface can be configured to enable unobstructed access for robotic manipulation of the device under test.