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1. (WO2018165066) DETECTOR ALIGNMENT ASSEMBLY AND METHOD
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CLAIMS:

1. An apparatus comprising:

a first source of electromagnetic radiation configured to project a first planar beam detectable along a first dimension; and

a second source of electromagnetic radiation configured to project a second planar beam detectable along a second linear dimension.

2. The apparatus of claim 1, wherein the second source of electromagnetic radiation is further configured to project a third planar beam detectable along a third linear dimension.

3. The apparatus of claim 2, wherein the first and second sources are configured such that the first, second and third planar beams are detectable between about one foot and about ten feet from the apparatus.

4. The apparatus of claim 2, wherein the first and second sources are configured such that the first, second and third planar beams are detectable between about one foot and about ten feet from the apparatus using a planar beam sensor assembly having an area of between about 16 square inches and about 900 square inches.

5. The apparatus of claim 2, wherein the second source is configured to project the second and third planar beams along transverse planes.

6. The apparatus of claim 2, wherein the second source is configured to project the second and third planar beams along perpendicular planes.

7. The apparatus of claim 2, wherein the first and second sources are configured such that the first linear dimension and the second linear dimension are detectible as parallel lines.

8. The apparatus of claim 2, wherein the first and second sources are configured such that the first linear dimension and the second linear dimension are detectible as collinear.

9. The apparatus of claim 8, wherein the first and second sources are configured such that the third linear dimension is detectible as being perpendicular to both the first and second linear dimensions.

10. The apparatus of claim 9, wherein the first and second sources comprise laser beam sources.

11. The apparatus of claim 2, wherein the first source of electromagnetic radiation is configured to project the first planar beam having a first detectible characteristic, and wherein the second source of electromagnetic radiation is configured to project the second planar beam having a second detectible characteristic different from the first detectible characteristic.

12. The apparatus of claim 11, wherein the first and second detectible characteristics are selected from the group consisting of wavelength and pulse frequency.

13. The apparatus of claim 2, further comprising a two dimensional array of imaging sensors configured to capture a radiographic image.

14. A method comprising:

emitting a planar laser beam from a first laser source;

emitting two cross-wise planar laser beams from a second laser source;

detecting relative positions of the planar laser beam and the two cross-wise planar laser beams using a planar detector positioned between about one foot and about ten feet from the first and second laser sources; and

determining a parallel and non-parallel position of the detector with respect to the first and second laser sources based on the relative positions of the planar laser beam and the two cross-wise planar laser beams.

15. The method of claim 14, further comprising attaching the detector to an x-ray source in a fixed spatial relationship thereto.