Mobile |
Deutsch |
Español |
Français |
日本語 |
한국어 |
Português |
Русский |
中文 |
العربية |
PATENTSCOPE
Search International and National Patent Collections
PATENTSCOPE will be unavailable a few hours for maintenance reason on Monday 18.02.2019 at 12:00 PM CET
Options
Query
Result
Interface
Office
Translate
Query Language
All
Arabic
Bulgarian
Chinese
Danish
English
Estonian
French
German
Hebrew
Indonesian
Italian
Japanese
Korean
Laotian
Polish
Portuguese
Romanian
Russian
Spanish
Swedish
Thai
Vietnamese
Stem
Sort by:
Relevance
Pub Date Desc
Pub Date Asc
App Date Desc
App Date Asc
List Length
10
50
100
200
Result List Language
Query Language
English
Spanish
Korean
Vietnamese
Hebrew
Portuguese
French
German
Japanese
Russian
Chinese
Italian
Polish
Danish
Swedish
Arabic
Estonian
Indonesian
Thai
Bulgarian
Laotian
Romanian
Displayed Fields
Application Number
Publication Date
Abstract
Applicant Name
Int. Class
Image
Inventor Name
Chart/Graph
Table
Graph
Group by
*
None
Offices of NPEs
IPC code
Applicants
Inventors
Filing Dates
Publication Dates
Countries
No of Items/Group
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
Download Fields
NPEs
Default Search Form
Simple
Advanced Search
Field Combination
Browse by Week (PCT)
Cross Lingual Expansion
Translator
Simple
Advanced Search
Field Combination
Browse by Week (PCT)
Cross Lingual Expansion
Translator
Default Tab Search Form
Front Page
Any Field
Full Text
ID/Numbers
IPC
Names
Dates
Front Page
Any Field
Full Text
ID/Numbers
IPC
Names
Dates
Interface Language
English
Deutsch
Français
Español
日本語
中文
한국어
Português
Русский
English
Deutsch
Français
Español
日本語
中文
한국어
Português
Русский
Multiple Windows Interface
Tooltip Help
IPC Tooltip Help
Instant Help
Expanded Query
Office:
All
All
PCT
Africa
African Regional Intellectual Property Organization (ARIPO)
Egypt
Kenya
Morocco
Tunisia
South Africa
Americas
United States of America
Canada
LATIPAT
Argentina
Brazil
Chile
Colombia
Costa Rica
Cuba
Dominican Rep.
Ecuador
El Salvador
Guatemala
Honduras
Mexico
Nicaragua
Panama
Peru
Uruguay
Asia-Europe
Australia
Bahrain
China
Denmark
Estonia
Eurasian Patent Office
European Patent Office (EPO)
France
Germany
Germany(DDR data)
Israel
Japan
Jordan
Portugal
Russian Federation
Russian Federation(USSR data)
Saudi Arabia
United Arab Emirates
Spain
Republic of Korea
India
United Kingdom
Georgia
Bulgaria
Italy
Romania
Lao People's Democratic Republic
Asean
Singapore
Viet Nam
Indonesia
Cambodia
Malaysia
Brunei Darussalam
Philippines
Thailand
WIPO translate (Wipo internal translation tool)
Search
Simple
Advanced Search
Field Combination
Cross Lingual Expansion
Chemical compounds (login required)
Browse
Browse by Week (PCT)
Gazette Archive
National Phase Entries
Full download
Incremental download (last 7 days)
Sequence listing
IPC Green Inventory
Portal to patent registers
Translate
WIPO Translate
WIPO Pearl
News
PATENTSCOPE News
Login
ui-button
Login
Account Sign Up
Options
Options
Help
ui-button
How to Search
User Guide PATENTSCOPE
User Guide: Cross Lingual Expansion
User Guide: ChemSearch
Query Syntax
Fields Definition
Country Code
Data Coverage
PCT applications
PCT national phase entry
National collections
Global Dossier public
FAQ
Feedback&Contact
INID codes
Kind codes
Tutorials
About
Overview
Terms And Conditions
Disclaimer
Home
IP Services
PATENTSCOPE
Machine translation
Wipo Translate
Arabic
German
English
Spanish
French
Japanese
Korean
Portuguese
Russian
Chinese
Google Translate
Bing/Microsoft Translate
Baidu Translate
Arabic
English
French
German
Spanish
Portuguese
Russian
Korean
Japanese
Chinese
...
Italian
Thai
Cantonese
Classical Chinese
Some content of this application is unavailable at the moment.
If this situation persist, please contact us at
Feedback&Contact
1. (WO2018163387) ANALYSIS DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM
PCT Biblio. Data
Full Text
Drawings
National Phase
Notices
Documents
Latest bibliographic data on file with the International Bureau
Submit observation
PermaLink
PermaLink
Bookmark
Pub. No.:
WO/2018/163387
International Application No.:
PCT/JP2017/009613
Publication Date:
13.09.2018
International Filing Date:
09.03.2017
IPC:
G06F 11/34
(2006.01)
G
PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
11
Error detection; Error correction; Monitoring
30
Monitoring
34
Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation
Applicants:
三菱電機株式会社 MITSUBISHI ELECTRIC CORPORATION
[JP/JP]; 東京都千代田区丸の内二丁目7番3号 7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1008310, JP
Inventors:
遠山 治 TOYAMA, Osamu
; JP
外山 正勝 TOYAMA, Masakatsu
; JP
Agent:
溝井国際特許業務法人 MIZOI INTERNATIONAL PATENT FIRM
; 神奈川県鎌倉市大船二丁目17番10号3階 3rd floor, 17-10, Ofuna 2-chome, Kamakura-shi, Kanagawa 2470056, JP
Priority Data:
Title
(EN)
ANALYSIS DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM
(FR)
DISPOSITIF D'ANALYSE, PROCÉDÉ D'ANALYSE ET PROGRAMME D'ANALYSE
(JA)
解析装置、解析方法及び解析プログラム
Abstract:
(EN)
A program division unit (200) divides a program (100) including a plurality of instruction sequences into a plurality of basic blocks. An instruction execution delay time calculation unit (50) acquires a measurement section information (520) which indicates a measurement section designated as a range for calculation of an instruction execution delay time in the program (100), extracts a basic block included in the measurement section from the plurality of basic blocks, and calculates the instruction execution delay time of the extracted basic block.
(FR)
L'invention concerne une unité de division de programme (200) qui divise un programme (100) comprenant une pluralité de séquences d'instructions en une pluralité de blocs de base. Une unité de calcul de temps de retard d'exécution d'instruction (50) acquiert des informations de section de mesure (520) qui indiquent une section de mesure désignée en tant que plage pour le calcul d'un temps de retard d'exécution d'instruction dans le programme (100), extrait un bloc de base compris dans la section de mesure à partir de la pluralité de blocs de base et calcule le temps de retard d'exécution d'instruction du bloc de base extrait.
(JA)
プログラム分割部(200)は、複数の命令列が含まれるプログラム(100)を複数の基本ブロックに分割する。命令実行遅延時間算出部(50)は、プログラム(100)内で命令実行遅延時間の算出の対象の範囲として指定された測定区間が示される測定区間情報(520)を取得し、複数の基本ブロックから測定区間に含まれる基本ブロックを抽出し、抽出した基本ブロックの命令実行遅延時間を算出する。
Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language:
Japanese (
JA
)
Filing Language:
Japanese (
JA
)