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1. (WO2018163342) ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD AND ABNORMALITY DETECTION PROGRAM

Pub. No.:    WO/2018/163342    International Application No.:    PCT/JP2017/009406
Publication Date: Fri Sep 14 01:59:59 CEST 2018 International Filing Date: Fri Mar 10 00:59:59 CET 2017
IPC: G06F 21/55
G06F 11/07
Applicants: NEC CORPORATION
日本電気株式会社
Inventors: YAMADA Yoshiyuki
山田 祥之
Title: ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD AND ABNORMALITY DETECTION PROGRAM
Abstract:
This abnormality detection device 10, which detects an abnormality of a data series to be detected that has regularity in a sequence of data forming the data series, is provided with: a determination unit 11 which refers to a data series of a normal model composed of a prescribed permutation as a data series that indicates a state in which a system to be detected is normal, and which, every time one piece of data is input, in light of a permutation indicated by a pair of the one piece of data and another piece of data input immediately before the one piece of data is input, determines that a data series to be detected is locally abnormal when the permutation is not included in a normal model, and determines that the data series to be detected is locally normal when the permutation is included in the normal model; and a data candidate holding unit 12 which holds at least one or more data candidates of the normal model, which are predicted to be subsequently input to the determination unit 11, when the determination unit 11 determines that the data series to be detected is locally normal.