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1. (WO2018162048) TEST APPARATUS AND METHOD FOR CHARACTERIZING A DEVICE UNDER TEST
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Claims

Test apparatus (2) for characterizing a device under test (4), the test apparatus (2) comprising:

a test case generator (6) configured to randomly generate a plurality of test cases (14), wherein a test case (14) comprises values of one or more input variables (16a, 16b) of a set of input variables (16);

a test unit (8) configured to perform the plurality of test cases (14) on the device under test (4);

a data storage unit (10) configured to store sets of test data (18), wherein the sets of test data (18) are associated to the test cases (14) and wherein the sets of test data comprise values of input variables of a respective test case and corresponding values of output variables of the device under test (4) related to the respective test case;

a data analysis unit (12) configured to analyze the test data ( 8), wherein the data analysis unit (12) is further configured to determine dependencies within a subset of variables of the test data to characterize the device under test.

Test apparatus (2) according to claim 1 , wherein the data analysis unit (12) is configured to project a plurality of sets of test data, which make up a N-dimensional space of variables, onto a M-dimensional space of variables, wherein M < N, in order to determine the dependencies.

Test apparatus (2) according to claim 2, wherein M < 6 and/or N≥ 5 * M.

Test apparatus according any of claims 1 to 3, wherein the set of input variables (16) comprises at least one of an information describing a stimulating signal (24), an information describing a condition under which the test is performed (26a, 26b), or an information about a firmware setting of the device under test (32).

Test apparatus (2) according to any of claims 1 to 4, wherein the test case generator (6) is configured to generate the plurality of test cases (14) by using at least one of random permutation of a nested loop or random sampling of a space of values of the set of input variables.

Test apparatus according to any of claims 1 to 5, wherein the test unit (8) is configured to perform the plurality of test cases using scheduling of multiple test tasks, wherein a test task comprises multiple test cases (14).

Test apparatus (2) according to any of claims 1 to 6, wherein the test case generator (6) is configured to randomly generate a plurality of test cases (14), wherein the test case generator (6) is configured to randomly generate values for the one or more input variables within an operating range of the device under test for the one or more input variables.

Test apparatus (2) according to any of claims 1 to 7, wherein the test case generator (6) is configured to randomly generate the plurality of test cases using the one or more input variables of the set of input variables (16), wherein the test case generator is configured to restrict the input variables to a subset of the set of input variables such that the input variables meet one or more equality or inequality constraints.

Test apparatus (2) according to any of claims 1 to 8, wherein the data storage unit (10) is configured to store a current set of test data directly after the current set of test data is created and/or wherein the data storage unit is configured to permanently store each set of test data.

10. Test apparatus (2) according to any of claims 1 to 9, wherein the data analysis unit is configured to use Least Absolute Shrinkage and Selection Operator (LASSO) regression to analyze the test data and wherein the data analysis unit is configured to analyze dependencies within a subset of M variables within the test data.

1 1 . Test apparatus (2) according to any of claims 1 to 10, wherein the data analysis unit (12) is configured to determine an error prone operating mode of the device under test (4), wherein the data analysis unit is configured to analyze test cases where an error occurred to identify dependencies within values of the one or more input variables used to generate the test cases where an error occurred.

Test apparatus according to any of claims 1 to 1 1 , wherein the test unit (8) is configured to perform the plurality of test cases (14) randomly on the device under test such that a space of values of variables of all sets of test data is randomly filled more and more by values of variables of a current and previous sets of test data.

Method (500) for characterizing a device under test, the method comprising:

randomly (505) generating a plurality of test cases, wherein a test case comprises values of one or more input variables of a set of input variables;

performing (510) the plurality of test cases on the device under test;

storing (515) sets of test data, wherein the sets of test data are associated to the test cases and wherein the sets of test data comprise values of input variables of a respective test case and corresponding values of output variables of the device under test related to the respective test case;

analyzing (520) the test data and determining dependencies between a subset of variables within the test data to characterize the device under test.

Computer program having a program code for performing the method according to claim 13 when the computer program runs on a computer.